On Testability Analysis Driven Generation of Synthetic Register-Transfer Level Benchmark Circuits

On Testability Analysis Driven Generation of Synthetic Register-Transfer Level Benchmark Circuits

Paper in proceedings outside WoS and Scopus

Use of benchmark designs has become an important part of a process of designing complex systems. However, existing register-transfer level benchmark suites are not sufficient for evaluation of new architectures and tools; synthetic benchmark circuits are an alternative. In the paper, it is demonstrated how evolutionary techniques can be used to generate synthetic benchmarks covering a wide scale of testability properties. The generation process is driven by a register-transfer level testability analysis method and generated benchmarks are stored in synthesizable VHDL source-code. Results gained by proposed method together with future research trends are discussed at the end of the paper.

Use of benchmark designs has become an important part of a process of designing complex systems. However, existing register-transfer level benchmark suites are not sufficient for evaluation of new architectures and tools; synthetic benchmark circuits are an alternative. In the paper, it is demonstrated how evolutionary techniques can be used to generate synthetic benchmarks covering a wide scale of testability properties. The generation process is driven by a register-transfer level testability analysis method and generated benchmarks are stored in synthesizable VHDL source-code. Results gained by proposed method together with future research trends are discussed at the end of the paper.

Register-transfer level, synthetic benchmark circuit, testability analysis, evolutionary algorithm

Register-transfer level, synthetic benchmark circuit, testability analysis, evolutionary algorithm

STRNADEL, J.; PEČENKA, T.; SEKANINA, L.

08.09.2005

Slovak University of Technology in Bratislava

Bratislava

Proceedings of 5th Electronic Circuits and Systems Conference

107

110

4

https://www.fit.vut.cz/research/publication/7867/

2005-ecs