A Simple Calorimetric Measurement of SiC MOSFET Switching Loss and Comparison with Electric Measurement

A Simple Calorimetric Measurement of SiC MOSFET Switching Loss and Comparison with Electric Measurement

Paper in proceedings (conference paper)

This paper proposes a simple and accessible method for dynamic calorimetric measurement of ultra-fast power semiconductor devices switching loss. It utilizes a temperature rise monitoring of a copper cube thermally coupled with a semiconductor chip. No special chambers or heat exchangers are used and no additional wiring compared to standard electric pulsed test. This provides an opportunity to perform a direct comparison with traditional electric power loss measurement, including all of the parasitic influences and further investigation of power loss with intentional varying of particular elements impact, which absent in available literature. The paper establishes the test method and setup as well a basic comparison of calorimetric and electric measurement.

This paper proposes a simple and accessible method for dynamic calorimetric measurement of ultra-fast power semiconductor devices switching loss. It utilizes a temperature rise monitoring of a copper cube thermally coupled with a semiconductor chip. No special chambers or heat exchangers are used and no additional wiring compared to standard electric pulsed test. This provides an opportunity to perform a direct comparison with traditional electric power loss measurement, including all of the parasitic influences and further investigation of power loss with intentional varying of particular elements impact, which absent in available literature. The paper establishes the test method and setup as well a basic comparison of calorimetric and electric measurement.

Power Semiconductor SiC MOSFET Switching Loss, Parasitic Waveform Distortion, Calorimetric Power Loss Measurement, Electrical Measurement, Double Pulse Test, Measurement Methods Comparison

Power Semiconductor SiC MOSFET Switching Loss, Parasitic Waveform Distortion, Calorimetric Power Loss Measurement, Electrical Measurement, Double Pulse Test, Measurement Methods Comparison

MIKLÁŠ, J.; PROCHÁZKA, P.

2023

26.04.2022

Brno University of Technology, Faculty of Electrical Engineering and Technology

Brno

978-80-214-6030-0

PROCEEDINGS II OF THE 28TH STUDENT EEICT 2022 Selected Papers

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198

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https://www.eeict.cz/eeict_download/archiv/sborniky/EEICT_2022_sbornik_2_v3.pdf