Publication result detail

Excitation in Time-Domain Analyses: A Pivotal Element for Accurate Simulations

GU, J.; VAN KRIEKEN, R.; ŠTUMPF, M.; LAGER, I.

Original Title

Excitation in Time-Domain Analyses: A Pivotal Element for Accurate Simulations

English Title

Excitation in Time-Domain Analyses: A Pivotal Element for Accurate Simulations

Type

Paper in proceedings (conference paper)

Original Abstract

A simple and efficacious modality of introducing causal excitations in CST Studio Suite time-domain simulations is described. It makes use of (concatenations of) so-called discrete ports that are shown to accurately substitute Dirichlet boundary conditions and replicate dipole excitations. Numerical experiments cogently demonstrate the approach's exceptional replication accuracy and computational effectiveness.

English abstract

A simple and efficacious modality of introducing causal excitations in CST Studio Suite time-domain simulations is described. It makes use of (concatenations of) so-called discrete ports that are shown to accurately substitute Dirichlet boundary conditions and replicate dipole excitations. Numerical experiments cogently demonstrate the approach's exceptional replication accuracy and computational effectiveness.

Keywords

computational electromagnetics; time-domain analysis; numerical analysis.

Key words in English

computational electromagnetics; time-domain analysis; numerical analysis.

Authors

GU, J.; VAN KRIEKEN, R.; ŠTUMPF, M.; LAGER, I.

RIV year

2023

Released

29.09.2022

Publisher

IEEE

Location

New York

ISBN

978-2-87487-068-2

Book

European Microwave Week 2022 Conference Proceedings

Pages from

234

Pages to

237

Pages count

4

URL

https://ieeexplore.ieee.org/abstract/document/9924345

BibTex

@inproceedings{BUT179822,
  author="GU, J. and VAN KRIEKEN, R. and ŠTUMPF, M. and LAGER, I.",
  title="Excitation in Time-Domain Analyses: A Pivotal Element for Accurate Simulations",
  booktitle="European Microwave Week 2022 Conference Proceedings",
  year="2022",
  pages="234--237",
  publisher="IEEE",
  address="New York",
  doi="10.23919/EuMC54642.2022.9924345",
  isbn="978-2-87487-068-2",
  url="https://ieeexplore.ieee.org/abstract/document/9924345"
}