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LENZ, S.; KERN, B.; SCHNEIDER, M.; VAN SLAGEREN, J.
Original Title
Measurement of quantum coherence in thin films of molecular quantum bits without post-processing
English Title
Type
WoS Article
Original Abstract
Thin film deposition of molecular quantum bits may further their integration into devices. Current electron paramagnetic resonance equipment is ill-suited for thin film investigations of spin dynamics. We present a 35 GHz Fabry-Perot resonator enabling such measurements and demonstrate its use in the study of different molecular quantum bits.
English abstract
Keywords
SPECTROMETER; SPINS; EPR
Key words in English
Authors
RIV year
2022
Released
02.07.2019
Publisher
ROYAL SOC CHEMISTRY
Location
CAMBRIDGE
ISBN
1359-7345
Periodical
CHEMICAL COMMUNICATIONS
Volume
55
Number
50
State
United Kingdom of Great Britain and Northern Ireland
Pages from
7163
Pages to
7166
Pages count
4
URL
https://pubs.rsc.org/en/content/articlelanding/2019/CC/C9CC02184A
BibTex
@article{BUT177359, author="Samuel {Lenz} and Bastian {Kern} and Martin {Schneider} and Joris {van Slageren}", title="Measurement of quantum coherence in thin films of molecular quantum bits without post-processing", journal="CHEMICAL COMMUNICATIONS", year="2019", volume="55", number="50", pages="7163--7166", doi="10.1039/c9cc02184a", issn="1359-7345", url="https://pubs.rsc.org/en/content/articlelanding/2019/CC/C9CC02184A" }