Publication detail

Survey of Partial Scan Methodologies

KOTÁSEK, Z.

Original Title

Survey of Partial Scan Methodologies

Type

conference paper

Language

English

Original Abstract

Partial scan methodologies are seen as an alternative to applying a test to a digital circuit. In the presentation a survey of the methodologies is given.

Keywords

digital circuit testability, test application

Authors

KOTÁSEK, Z.

Released

18. 4. 2004

Publisher

Slovak Academy of Science

Location

Bratislava

Pages from

1

Pages to

77

Pages count

77

BibTex

@inproceedings{BUT17574,
  author="Zdeněk {Kotásek}",
  title="Survey of Partial Scan Methodologies",
  booktitle="Research and Training Action for System on Chip Design, 5th FP Project",
  year="2004",
  pages="77",
  publisher="Slovak Academy of Science",
  address="Bratislava"
}