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GUEN, E.; KLAPETEK, P.; PUTTOCK, R.; HAY, B.; ALLARD, A.; MAXWELL, T.; CHAPUIS, P.O.; RENAHY, D.; DAVEE, G.; VALTR, M.; MARTINEK, J.; KAZAKOVA, O.; GOMES, S.
Original Title
SThM-based local thermomechanical analysis: Measurement intercomparison and uncertainty analysis
English Title
Type
WoS Article
Original Abstract
We assess Scanning Thermal Microscopy (SThM) with a self-heated doped silicon nanoprobe as a method for determining the local phase transition temperature of polymeric materials by means of nano-thermomechanical analysis (nano-TA).
English abstract
Keywords
Scanning Thermal Microscopy; thermomechanical analysis; uncertainty
Key words in English
Authors
RIV year
2021
Released
30.05.2020
Publisher
Elsevier
Location
Amsterdam, NL
ISBN
1290-0729
Periodical
INTERNATIONAL JOURNAL OF THERMAL SCIENCES
Volume
156
Number
106502
State
French Republic
Pages from
1
Pages to
9
Pages count
URL
https://www.scopus.com/record/display.uri?eid=2-s2.0-85085270541&origin=resultslist
BibTex
@article{BUT170099, author="GUEN, E. and KLAPETEK, P. and PUTTOCK, R. and HAY, B. and ALLARD, A. and MAXWELL, T. and CHAPUIS, P.O. and RENAHY, D. and DAVEE, G. and VALTR, M. and MARTINEK, J. and KAZAKOVA, O. and GOMES, S.", title="SThM-based local thermomechanical analysis: Measurement intercomparison and uncertainty analysis", journal="INTERNATIONAL JOURNAL OF THERMAL SCIENCES", year="2020", volume="156", number="106502", pages="1--9", doi="10.1016/j.ijthermalsci.2020.106502", issn="1290-0729", url="https://www.scopus.com/record/display.uri?eid=2-s2.0-85085270541&origin=resultslist" }