Publication detail

SThM-based local thermomechanical analysis: Measurement intercomparison and uncertainty analysis

GUEN, E. KLAPETEK, P. PUTTOCK, R. HAY, B. ALLARD, A. MAXWELL, T. CHAPUIS, P.O. RENAHY, D. DAVEE, G. VALTR, M. MARTINEK, J. KAZAKOVA, O. GOMES, S.

Original Title

SThM-based local thermomechanical analysis: Measurement intercomparison and uncertainty analysis

Type

journal article in Web of Science

Language

English

Original Abstract

We assess Scanning Thermal Microscopy (SThM) with a self-heated doped silicon nanoprobe as a method for determining the local phase transition temperature of polymeric materials by means of nano-thermomechanical analysis (nano-TA).

Keywords

Scanning Thermal Microscopy; thermomechanical analysis; uncertainty

Authors

GUEN, E.; KLAPETEK, P.; PUTTOCK, R.; HAY, B.; ALLARD, A.; MAXWELL, T.; CHAPUIS, P.O.; RENAHY, D.; DAVEE, G.; VALTR, M.; MARTINEK, J.; KAZAKOVA, O.; GOMES, S.

Released

30. 5. 2020

Publisher

Elsevier

Location

Amsterdam, NL

ISBN

1290-0729

Periodical

INTERNATIONAL JOURNAL OF THERMAL SCIENCES

Year of study

156

Number

106502

State

French Republic

Pages from

1

Pages to

9

Pages count

9

URL

https://www.scopus.com/record/display.uri?eid=2-s2.0-85085270541&origin=resultslist

BibTex

@article{BUT170099,
  author="GUEN, E. and KLAPETEK, P. and PUTTOCK, R. and HAY, B. and ALLARD, A. and MAXWELL, T. and CHAPUIS, P.O. and RENAHY, D. and DAVEE, G. and VALTR, M. and MARTINEK, J. and KAZAKOVA, O. and GOMES, S.",
  title="SThM-based local thermomechanical analysis: Measurement intercomparison and uncertainty analysis",
  journal="INTERNATIONAL JOURNAL OF THERMAL SCIENCES",
  year="2020",
  volume="156",
  number="106502",
  pages="1--9",
  doi="10.1016/j.ijthermalsci.2020.106502",
  issn="1290-0729",
  url="https://www.scopus.com/record/display.uri?eid=2-s2.0-85085270541&origin=resultslist"
}