Publication result detail

Optimized Impedance Measurement with AD5933

EHLICH, J.; ZHIVKOV, I.; YORDANOV, R.; SALYK, O.; WEITER, M.

Original Title

Optimized Impedance Measurement with AD5933

English Title

Optimized Impedance Measurement with AD5933

Type

Paper in proceedings (conference paper)

Original Abstract

The publication describes a new method of better impedance measuremnt with AD5933 chip with custom analog frontend.

English abstract

The publication describes a new method of better impedance measuremnt with AD5933 chip with custom analog frontend.

Keywords

Impedance, AD5933, analog frontend

Key words in English

Impedance, AD5933, analog frontend

Authors

EHLICH, J.; ZHIVKOV, I.; YORDANOV, R.; SALYK, O.; WEITER, M.

RIV year

2021

Released

14.05.2020

Publisher

International Spring Seminar on Electronics Technology

Location

Slovakia

ISBN

9781728167732

Book

Proceedings of the International Spring Seminar on Electronics Technology

Edition

May 2020

Pages from

1

Pages to

6

Pages count

6

URL

https://ieeexplore.ieee.org/document/9121159

BibTex

@inproceedings{BUT164754,
  author="EHLICH, J. and ZHIVKOV, I. and YORDANOV, R. and SALYK, O. and WEITER, M.",
  title="Optimized Impedance Measurement with AD5933",
  booktitle="Proceedings of the International Spring Seminar on Electronics Technology",
  year="2020",
  series="May 2020",
  pages="1--6",
  publisher="International Spring Seminar on Electronics Technology",
  address="Slovakia",
  doi="10.1109/ISSE49702.2020.9121159",
  isbn="9781728167732",
  url="https://ieeexplore.ieee.org/document/9121159"
}