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STARKOV, A.; STARKOV, I.
Original Title
Electroelastic Field of a Sphere Located in the Vicinity of a Plane Piezoelectric Surface
English Title
Type
WoS Article
Original Abstract
The electric field generated by a scanning probe microscope is determined. Analytical expressions for the electroelastic field in a piezoelectric sample and the external electric field are derived for a spherical probe. It is demonstrated that the coupling of elastic and electrostatic fields in the piezoelectric material leads to energy redistribution between such fields. This circumstance causes variations in the normal component of the electric field strength at the interface and the capacitance of a probe.
English abstract
Keywords
Scanning probe microscope, electroelastic field, pietoelectric material
Key words in English
Authors
RIV year
2020
Released
15.01.2016
Publisher
PLEIADES PUBLISHING INC
Location
MOSCOW
ISBN
1063-7842
Periodical
TECHNICAL PHYSICS
Volume
61
Number
1
State
Russian Federation
Pages from
23
Pages to
27
Pages count
5
URL
https://link.springer.com/article/10.1134/S1063784216010217
BibTex
@article{BUT163514, author="Alexander {Starkov} and Ivan {Starkov}", title="Electroelastic Field of a Sphere Located in the Vicinity of a Plane Piezoelectric Surface", journal="TECHNICAL PHYSICS", year="2016", volume="61", number="1", pages="23--27", doi="10.1134/S1063784216010217", issn="1063-7842", url="https://link.springer.com/article/10.1134/S1063784216010217" }