Publication result detail

Low temperature selective growth of GaN single crystals on pre-patterned Si substrates

MACH, J.; PIASTEK, J.; MANIŠ, J.; ČALKOVSKÝ, V.; ŠAMOŘIL, T.; FLAJŠMANOVÁ, J.; BARTOŠÍK, M.; VOBORNÝ, S.; KONEČNÝ, M.; ŠIKOLA, T.

Original Title

Low temperature selective growth of GaN single crystals on pre-patterned Si substrates

English Title

Low temperature selective growth of GaN single crystals on pre-patterned Si substrates

Type

WoS Article

Original Abstract

We report on a hybrid method for fabrication of arrays of GaN nanocrystals by low-temperature UHV selective growth on pre-patterned silicon substrates covered by native oxide. Patterning of the substrates was performed by using a gallium focused ion beam (FIB). To get GaN nanocrystals at specific positions, Ga droplets were created at FIB patterned sites by evaporation of Ga atoms at 280°C substrate temperature first, and then modified by their post-nitridation using an ultra-low energy (50eV) nitrogen ion–beam at a sample temperature of 200 °C. To get larger arrays of GaN nanocrystals (≈150nm and 200nm in diameter), such a sequential process was repeated in several cycles at slightly modified operation conditions. The quality of the nanocrystals was checked by measurement of their photoluminescence properties which proved the occurrence of the peak of a band edge emission at around 367nm (3.38 eV).

English abstract

We report on a hybrid method for fabrication of arrays of GaN nanocrystals by low-temperature UHV selective growth on pre-patterned silicon substrates covered by native oxide. Patterning of the substrates was performed by using a gallium focused ion beam (FIB). To get GaN nanocrystals at specific positions, Ga droplets were created at FIB patterned sites by evaporation of Ga atoms at 280°C substrate temperature first, and then modified by their post-nitridation using an ultra-low energy (50eV) nitrogen ion–beam at a sample temperature of 200 °C. To get larger arrays of GaN nanocrystals (≈150nm and 200nm in diameter), such a sequential process was repeated in several cycles at slightly modified operation conditions. The quality of the nanocrystals was checked by measurement of their photoluminescence properties which proved the occurrence of the peak of a band edge emission at around 367nm (3.38 eV).

Keywords

GaN; Deposition; Selective growth; Low energy ions; Nanocrystals; Photoluminescence

Key words in English

GaN; Deposition; Selective growth; Low energy ions; Nanocrystals; Photoluminescence

Authors

MACH, J.; PIASTEK, J.; MANIŠ, J.; ČALKOVSKÝ, V.; ŠAMOŘIL, T.; FLAJŠMANOVÁ, J.; BARTOŠÍK, M.; VOBORNÝ, S.; KONEČNÝ, M.; ŠIKOLA, T.

RIV year

2020

Released

14.08.2019

ISBN

0169-4332

Periodical

APPLIED SURFACE SCIENCE

Volume

497

Number

143705

State

Kingdom of the Netherlands

Pages from

1

Pages to

7

Pages count

7

URL

BibTex

@article{BUT161424,
  author="Jindřich {Mach} and Jakub {Piastek} and Jaroslav {Maniš} and Vojtěch {Čalkovský} and Tomáš {Šamořil} and Jana {Flajšmanová} and Miroslav {Bartošík} and Stanislav {Voborný} and Martin {Konečný} and Tomáš {Šikola}",
  title="Low temperature selective growth of GaN single crystals on pre-patterned Si substrates",
  journal="APPLIED SURFACE SCIENCE",
  year="2019",
  volume="497",
  number="143705",
  pages="1--7",
  doi="10.1016/j.apsusc.2019.143705",
  issn="0169-4332",
  url="https://www.sciencedirect.com/science/article/pii/S0169433219325024"
}

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