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NOVÁK, L.; ŠTEFFAN, P.
Original Title
Fast process detection of the chemical elements
English Title
Type
Peer-reviewed article not indexed in WoS or Scopus
Original Abstract
This paper describes a Fast mapping of the material composition via Sci-Trace devices. The measurement method is used LIBS (Laser Induced Breakdown Spectroscopy) for detection of the chemical elements. The method of fast mapping is implemented in the program LabView. In the paper is only mentioned the diagram of the process measurement implemented in LabView. The same program controls the whole electronic part of the devices. This paper compares two methods for data collection. Both methods are compared and described their advantages and disadvantages.
English abstract
Keywords
LIBS, Fast process mapping, Layout detection, Chemical elements, LabView
Key words in English
Authors
RIV year
2021
Released
21.10.2019
Publisher
Electroscope
Location
Univezitní 8 Plzeň
ISBN
1802-4564
Periodical
ElectroScope - http://www.electroscope.zcu.cz
Volume
2019
Number
2
State
Czech Republic
Pages from
1
Pages to
3
Pages count
URL
http://electroscope.zcu.cz/
BibTex
@article{BUT159529, author="Lukáš {Novák} and Pavel {Šteffan}", title="Fast process detection of the chemical elements", journal="ElectroScope - http://www.electroscope.zcu.cz", year="2019", volume="2019", number="2", pages="1--3", issn="1802-4564", url="http://electroscope.zcu.cz/" }
Documents
IMAPS 2019 - Novak Full Paper