Detail publikačního výsledku

Modern TFT sensor measurement method

Pavel Šteffan, Lukáš Fujcik, Radimír Vrba, Roman Prokop

Original Title

Modern TFT sensor measurement method

English Title

Modern TFT sensor measurement method

Type

Paper in proceedings (conference paper)

Original Abstract

This paper focuses to modern TFT sensors measurement method. This method used new design of a monolithic ASIC for measurement TFT sensor. The sensor applies alumina substrate prepared by thick film technology. The ASIC prototype in CMOS 0.7 µm technology contains analog measurement block and programmable digital calibration EPROM memory on one chip.

English abstract

This paper focuses to modern TFT sensors measurement method. This method used new design of a monolithic ASIC for measurement TFT sensor. The sensor applies alumina substrate prepared by thick film technology. The ASIC prototype in CMOS 0.7 µm technology contains analog measurement block and programmable digital calibration EPROM memory on one chip.

Keywords

potentiostat, TFT sensor, measurement

Key words in English

potentiostat, TFT sensor, measurement

Authors

Pavel Šteffan, Lukáš Fujcik, Radimír Vrba, Roman Prokop

Released

24.10.2005

Publisher

Nakl. Novotny

Location

Brno

ISBN

80-214-3089-3

Book

Moderní metody řešení, návrhu a aplikace elektronických obvodů

Pages from

71

Pages count

4

Full text in the Digital Library

http://hdl.handle.net/

BibTex

@inproceedings{BUT15854,
  author="Pavel {Šteffan} and Lukáš {Fujcik} and Radimír {Vrba} and Roman {Prokop}",
  title="Modern TFT sensor measurement method",
  booktitle="Moderní metody řešení, návrhu a aplikace elektronických obvodů",
  year="2005",
  pages="4",
  publisher="Nakl. Novotny",
  address="Brno",
  isbn="80-214-3089-3"
}