Publication result detail

CCD and scientific-CMOS detectors for submicron laboratory based X-ray Computed Tomography

ŠALPLACHTA, J.; ZIKMUND, T.; HORVÁTH, M., TAKEDA, Y., OMOTE, K., PÍNA, L., KAISER, J.

Original Title

CCD and scientific-CMOS detectors for submicron laboratory based X-ray Computed Tomography

English Title

CCD and scientific-CMOS detectors for submicron laboratory based X-ray Computed Tomography

Type

Peer-reviewed article not indexed in WoS or Scopus

Original Abstract

The key component of any CT (X-ray computed tomography) machine is a detection system. In area of scientific CT imaging applications three types of sensors are mainly used. These are amorphous silicon (α-Si) flat panels, complementary metal–oxide–semiconductor (CMOS) and charge-coupled device (CCD) sensors. Here the performance and comparison study of the two lastly named sensor types is conducted in field of high resolution CT imaging. CCD and novel sCMOS-based (scientific CMOS) detection systems are tested using high-resolution laboratory-based Rigaku nano3DX system (ability to achieve submicron voxel resolution). Properties of each camera were evaluated as well as the quality and noise properties of acquired data (both projectionand CT data).

English abstract

The key component of any CT (X-ray computed tomography) machine is a detection system. In area of scientific CT imaging applications three types of sensors are mainly used. These are amorphous silicon (α-Si) flat panels, complementary metal–oxide–semiconductor (CMOS) and charge-coupled device (CCD) sensors. Here the performance and comparison study of the two lastly named sensor types is conducted in field of high resolution CT imaging. CCD and novel sCMOS-based (scientific CMOS) detection systems are tested using high-resolution laboratory-based Rigaku nano3DX system (ability to achieve submicron voxel resolution). Properties of each camera were evaluated as well as the quality and noise properties of acquired data (both projectionand CT data).

Keywords

X-ray imaging, X-ray Computed Tomography, image detectors, CCD, sCMOS, image quality evaluation

Key words in English

X-ray imaging, X-ray Computed Tomography, image detectors, CCD, sCMOS, image quality evaluation

Authors

ŠALPLACHTA, J.; ZIKMUND, T.; HORVÁTH, M., TAKEDA, Y., OMOTE, K., PÍNA, L., KAISER, J.

RIV year

2019

Released

04.03.2019

Publisher

NDT.net

ISBN

1435-4934

Periodical

The e-Journal of Nondestructive Testing

Number

2019

State

Federal Republic of Germany

Pages from

1

Pages to

8

Pages count

8

URL

https://www.ndt.net/search/docs.php3?showForm=off&id=23697

BibTex

@article{BUT156650,
  author="Jakub {Šalplachta} and Tomáš {Zikmund} and Jozef {Kaiser}",
  title="CCD and scientific-CMOS detectors for submicron laboratory based X-ray
Computed Tomography",
  journal="The e-Journal of Nondestructive Testing",
  year="2019",
  number="2019",
  pages="1--8",
  issn="1435-4934",
  url="https://www.ndt.net/search/docs.php3?showForm=off&id=23697"
}