Publication result detail

Large area scanning thermal microscopy and infrared imaging system

MARTINEK, J.; VALTR, M.; GROLICH, P.; HORTVÍK, V.; DANICK, B.; SHAKER, M.; KLAPETEK, P.

Original Title

Large area scanning thermal microscopy and infrared imaging system

English Title

Large area scanning thermal microscopy and infrared imaging system

Type

WoS Article

Original Abstract

This paper describes two calibrated methods to determine the temperature map of micro- and nano- devices.

English abstract

This paper describes two calibrated methods to determine the temperature map of micro- and nano- devices.

Keywords

scanning thermal microscopy; large area SPM; finite element method

Key words in English

scanning thermal microscopy; large area SPM; finite element method

Authors

MARTINEK, J.; VALTR, M.; GROLICH, P.; HORTVÍK, V.; DANICK, B.; SHAKER, M.; KLAPETEK, P.

RIV year

2019

Released

14.02.2019

ISBN

1361-6501

Periodical

MEASUREMENT SCIENCE and TECHNOLOGY

Number

30

State

United Kingdom of Great Britain and Northern Ireland

Pages from

1

Pages to

12

Pages count

12

URL

https://iopscience.iop.org/article/10.1088/1361-6501/aafa96

Full text in the Digital Library

http://hdl.handle.net/

BibTex

@article{BUT156323,
  author="Jan {Martinek} and Miroslav {Valtr} and Petr {Grolich} and Václav {Hortvík} and Briand {danick} and Marjan {Shaker} and Petr {Klapetek}",
  title="Large area scanning thermal microscopy and infrared imaging system",
  journal="MEASUREMENT SCIENCE and TECHNOLOGY",
  year="2019",
  number="30",
  pages="1--12",
  doi="10.1088/1361-6501/aafa96",
  issn="0957-0233",
  url="https://iopscience.iop.org/article/10.1088/1361-6501/aafa96"
}