Publication result detail

Special Session: How Approximate Computing impacts Verification, Test and Reliability

SEKANINA, L.; VAŠÍČEK, Z.; BOSIO, A.; TRAIOLA, M.; RECH, P.; OLIVEIRA, D.; FERNANDES, F.; DI CARLO, S.

Original Title

Special Session: How Approximate Computing impacts Verification, Test and Reliability

English Title

Special Session: How Approximate Computing impacts Verification, Test and Reliability

Type

Abstract

Original Abstract

A new designparadigm -- approximate computing -- was established to investigate howcomputer systems can be made better -- more energy efficient, faster, andless complex -- by relaxing the requirement that they areexactly correct. The purpose of this special session is to introduce anddiscuss how approximate computing can and how impact the verification, the testand the reliability of digital circuits. The presentations of the specialsession will propose two views: (i): how theapproximate computing paradigm impacts the design and manufacturing flow ofintegrated circuits; (ii): how theverification, testing and reliability disciplines can be exploited in theapproximate computing paradigms.

English abstract

A new designparadigm -- approximate computing -- was established to investigate howcomputer systems can be made better -- more energy efficient, faster, andless complex -- by relaxing the requirement that they areexactly correct. The purpose of this special session is to introduce anddiscuss how approximate computing can and how impact the verification, the testand the reliability of digital circuits. The presentations of the specialsession will propose two views: (i): how theapproximate computing paradigm impacts the design and manufacturing flow ofintegrated circuits; (ii): how theverification, testing and reliability disciplines can be exploited in theapproximate computing paradigms.

Keywords

digital circuit, approximate computing, verification, test, reliability

Key words in English

digital circuit, approximate computing, verification, test, reliability

Authors

SEKANINA, L.; VAŠÍČEK, Z.; BOSIO, A.; TRAIOLA, M.; RECH, P.; OLIVEIRA, D.; FERNANDES, F.; DI CARLO, S.

RIV year

2019

Released

26.04.2018

Publisher

IEEE Computer Society

Location

San Francisco

ISBN

978-1-5386-3774-6

Book

2018 IEEE 36th VLSI Test Symposium

Pages count

1

URL

https://www.fit.vut.cz/research/publication/11726/

BibTex

@misc{BUT155724,
  author="SEKANINA, L. and VAŠÍČEK, Z. and BOSIO, A. and TRAIOLA, M. and RECH, P. and OLIVEIRA, D. and FERNANDES, F. and DI CARLO, S.",
  title="Special Session: How Approximate Computing impacts Verification, Test and Reliability",
  booktitle="2018 IEEE 36th VLSI Test Symposium",
  year="2018",
  pages="1",
  publisher="IEEE Computer Society",
  address="San Francisco",
  doi="10.1109/VTS.2018.8368628",
  isbn="978-1-5386-3774-6",
  url="https://www.fit.vut.cz/research/publication/11726/",
  note="Abstract"
}

Documents

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