Publication result detail

Protection Against PID Degradation at Photovoltaic Cell Level

HYLSKÝ, J.; STRACHALA, D.; ČUDEK, P.; VANĚK, J.

Original Title

Protection Against PID Degradation at Photovoltaic Cell Level

English Title

Protection Against PID Degradation at Photovoltaic Cell Level

Type

Paper in proceedings (conference paper)

Original Abstract

Nowadays, we find many scientific papers dealing with the potential induced degradation, in which authors attempt to achieve PID resistive photovoltaic cells. This work deals with the electrical properties of the newly created P-type photovoltaic cell. The IV-characteristics and external quantum efficiency of the newly created and reference samples are compared. To verify the resistivity of the newly created photovoltaic cell against PID, both samples were artificially degraded

English abstract

Nowadays, we find many scientific papers dealing with the potential induced degradation, in which authors attempt to achieve PID resistive photovoltaic cells. This work deals with the electrical properties of the newly created P-type photovoltaic cell. The IV-characteristics and external quantum efficiency of the newly created and reference samples are compared. To verify the resistivity of the newly created photovoltaic cell against PID, both samples were artificially degraded

Keywords

Potential Induced Degradation

Key words in English

Potential Induced Degradation

Authors

HYLSKÝ, J.; STRACHALA, D.; ČUDEK, P.; VANĚK, J.

RIV year

2019

Released

09.11.2018

Publisher

ECS Transaction

Location

Brno

ISBN

978-1-60768-864-8

Book

ECS Transactions

Edition

87

ISBN

1938-5862

Periodical

ECS Transactions

Volume

87

Number

1

State

United States of America

Pages from

221

Pages to

225

Pages count

5

URL

https://iopscience.iop.org/article/10.1149/08701.0221ecst/pdf

BibTex

@inproceedings{BUT150479,
  author="Josef {Hylský} and Dávid {Strachala} and Pavel {Čudek} and Jiří {Vaněk}",
  title="Protection Against PID Degradation at Photovoltaic Cell Level",
  booktitle="ECS Transactions",
  year="2018",
  series="87",
  journal="ECS Transactions",
  volume="87",
  number="1",
  pages="221--225",
  publisher="ECS Transaction",
  address="Brno",
  doi="10.1149/08701.0221ecst",
  isbn="978-1-60768-864-8",
  issn="1938-5862",
  url="https://iopscience.iop.org/article/10.1149/08701.0221ecst/pdf"
}

Documents

Hylský_2018_ECS_Trans._87_221