Publication result detail

SPM methods for nanotechnology

Jaroslav Kala

Original Title

SPM methods for nanotechnology

English Title

SPM methods for nanotechnology

Type

Paper in proceedings (conference paper)

Original Abstract

The paper describes two methods from SPM (Scanning Probe Microscopy) family and their junction. First part is dealing with common description of STM (Scanning Tunneling Microscopy) method and its advantages and disadvantages. Two modes of TS 3130 modified STM are described. The 3D processing and its benefit for defectoscopy and SPM methods are studied. The details about SNOM (Scanning Near-field Optical Microscopy) method, its advantages and disadvantages in the local nondestructive measurement are also presented

English abstract

The paper describes two methods from SPM (Scanning Probe Microscopy) family and their junction. First part is dealing with common description of STM (Scanning Tunneling Microscopy) method and its advantages and disadvantages. Two modes of TS 3130 modified STM are described. The 3D processing and its benefit for defectoscopy and SPM methods are studied. The details about SNOM (Scanning Near-field Optical Microscopy) method, its advantages and disadvantages in the local nondestructive measurement are also presented

Keywords

SPM, STM, SNOM, nanotechnology

Key words in English

SPM, STM, SNOM, nanotechnology

Authors

Jaroslav Kala

Released

14.08.2005

Publisher

University of Miskolc, Hungary

ISBN

9636616735

Book

5th INTERNATIONAL CONFERENCE OF PHD STUDENTS

Edition

1

Volume

1

Pages from

79

Pages count

6

BibTex

@inproceedings{BUT14972,
  author="Jaroslav {Kala}",
  title="SPM methods for nanotechnology",
  booktitle="5th INTERNATIONAL CONFERENCE OF PHD STUDENTS",
  year="2005",
  series="1",
  volume="1",
  number="1",
  pages="6",
  publisher="University of Miskolc, Hungary",
  isbn="9636616735"
}