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Detail publikačního výsledku
DUŠEK, J.; MIKULKA, J.; VÉJAR, A.; RYMARCZYK, T.
Original Title
Convergence error exploration for electrical impedance tomography problems with open and closed domains
English Title
Type
Paper in proceedings (conference paper)
Original Abstract
A fundamental part of the design of electrical impedance tomography (EIT) experiments is the selection of the structure of the computational mesh. Individual mesh elements are required to be sufficiently small to recover the behavior stated on the partial differential equations (PDE) EIT model. On the contrary, mesh elements needs to be not so small to fit the computation constraints of modern hardware. The target is to allow a fast iterative execution of the PDE model as performed by many optimization schemes. The estimation of the error over a reference mesh size is an important factor to compare with the total computation time for mesh generation, forward model evaluation, and tomographic inversion. In this work, we analyze the a posteriori convergence of EIT image reconstruction algorithms with respect to the mesh element size and computation time for open and closed domains. The tomographic inversion error is estimated using Euclidean and Jaccard distances for the output images.
English abstract
Keywords
Electrical impedance tomography; inverse problem; error convergence; finite element method
Key words in English
Authors
RIV year
2019
Released
12.05.2018
Location
Swinoujscie, Polsko
ISBN
978-83-7663-250-6
Book
Proceedings of IIPhDW 2018 in Swinouscie
Pages from
39
Pages to
44
Pages count
6
URL
https://ieeexplore.ieee.org/document/8388241
Full text in the Digital Library
http://hdl.handle.net/
BibTex
@inproceedings{BUT147550, author="Jan {Dušek} and Jan {Mikulka} and Andrés {Véjar} and Tomasz {Rymarczyk}", title="Convergence error exploration for electrical impedance tomography problems with open and closed domains", booktitle="Proceedings of IIPhDW 2018 in Swinouscie", year="2018", pages="39--44", address="Swinoujscie, Polsko", doi="10.1109/IIPHDW.2018.8388241", isbn="978-83-7663-250-6", url="https://ieeexplore.ieee.org/document/8388241" }