Publication result detail

Dual-polarization interference microscopy for advanced quantification of phase associated with the image field

BOUCHAL, P.; CHMELÍK, R.; BOUCHAL, Z.

Original Title

Dual-polarization interference microscopy for advanced quantification of phase associated with the image field

English Title

Dual-polarization interference microscopy for advanced quantification of phase associated with the image field

Type

WoS Article

Original Abstract

A new concept of dual-polarization spatial light interference microscopy (DPSLIM) is proposed and demonstrated experimentally. The method works with two orthogonally polarized modes in which signal and reference waves are combined to realize the polarization-sensitive phase-shifting, thus allowing advanced reconstruction of the phase associated with the image field. The image phase is reconstructed directly from four polarization encoded interference records by a single step processing. This is a progress compared with common methods, in which the phase of the image field is reconstructed using the optical path difference and the amplitudes of interfering waves, which are calculated in multiple-step processing of the records. The DPSLIM is implemented in a common-path configuration using a spatial light modulator, which is connected to a commercial microscope Nikon E200. The optical performance of the method is demonstrated in experiments using both polystyrene microspheres and live LW13K2 cells.

English abstract

A new concept of dual-polarization spatial light interference microscopy (DPSLIM) is proposed and demonstrated experimentally. The method works with two orthogonally polarized modes in which signal and reference waves are combined to realize the polarization-sensitive phase-shifting, thus allowing advanced reconstruction of the phase associated with the image field. The image phase is reconstructed directly from four polarization encoded interference records by a single step processing. This is a progress compared with common methods, in which the phase of the image field is reconstructed using the optical path difference and the amplitudes of interfering waves, which are calculated in multiple-step processing of the records. The DPSLIM is implemented in a common-path configuration using a spatial light modulator, which is connected to a commercial microscope Nikon E200. The optical performance of the method is demonstrated in experiments using both polystyrene microspheres and live LW13K2 cells.

Keywords

Interference microscopy,Spatial light modulators, Polarization-selective devices

Key words in English

Interference microscopy,Spatial light modulators, Polarization-selective devices

Authors

BOUCHAL, P.; CHMELÍK, R.; BOUCHAL, Z.

RIV year

2019

Released

01.02.2018

Publisher

Optical Society of America

Location

MASSACHUSETTS AVE NW, WASHINGTON, DC 20036 USA

ISBN

1539-4794

Periodical

OPTICS LETTERS

Volume

43

Number

3

State

United States of America

Pages from

427

Pages to

430

Pages count

4

URL

https://www.osapublishing.org/ol/abstract.cfm?uri=ol-43-3-427

BibTex

@article{BUT144295,
  author="Petr {Bouchal} and Radim {Chmelík} and Zdeněk {Bouchal}",
  title="Dual-polarization interference microscopy for advanced quantification of phase associated with the image field",
  journal="OPTICS LETTERS",
  year="2018",
  volume="43",
  number="3",
  pages="427--430",
  doi="10.1364/OL.43.000427",
  issn="0146-9592",
  url="https://www.osapublishing.org/ol/abstract.cfm?uri=ol-43-3-427"
}