Publication result detail

Methodologies of RTL Partial Scan Analysis and Their Comparison

KOTÁSEK, Z.; MIKA, D.; STRNADEL, J.

Original Title

Methodologies of RTL Partial Scan Analysis and Their Comparison

English Title

Methodologies of RTL Partial Scan Analysis and Their Comparison

Type

Paper in proceedings outside WoS and Scopus

Original Abstract

In the paper, two different methodologies for the identification ofregisters to be included into the partial scan chain and principles oftheir implementation are described briefly. One of them is based on theutilisation of genetic algorithms, the other one on the identificationof feedback loops. An attention is paid to the computation of time andspace complexities of the developed algorithms. The possibility of thecomplete state-space exploration (all possible scan chainconfigurations) is also discussed. It is derived that algorithms basedon genetic algorithms allow to gain sub-optimal solutions whilefulfilling user requirements. The combination of both methodologies isinvestigated and the complexities analysed. Experimental results aredescribed.

English abstract

In the paper, two different methodologies for the identification ofregisters to be included into the partial scan chain and principles oftheir implementation are described briefly. One of them is based on theutilisation of genetic algorithms, the other one on the identificationof feedback loops. An attention is paid to the computation of time andspace complexities of the developed algorithms. The possibility of thecomplete state-space exploration (all possible scan chainconfigurations) is also discussed. It is derived that algorithms basedon genetic algorithms allow to gain sub-optimal solutions whilefulfilling user requirements. The combination of both methodologies isinvestigated and the complexities analysed. Experimental results aredescribed.

Keywords

Register Transfer Level, Feedback Loop, Genetic Algorithm

Key words in English

Register Transfer Level, Feedback Loop, Genetic Algorithm

Authors

KOTÁSEK, Z.; MIKA, D.; STRNADEL, J.

Released

14.04.2003

Publisher

Publishing House of Poznan University of Technology

Location

Poznaň

ISBN

83-7143-557-6

Book

Proceeding of IEEE Workshop on Design and Diagnostic of Electronic Circuits and Systems

Pages from

233

Pages to

238

Pages count

6

BibTex

@inproceedings{BUT13958,
  author="Zdeněk {Kotásek} and Daniel {Mika} and Josef {Strnadel}",
  title="Methodologies of RTL Partial Scan Analysis and Their Comparison",
  booktitle="Proceeding of IEEE Workshop on Design and Diagnostic of Electronic Circuits and Systems",
  year="2003",
  pages="233--238",
  publisher="Publishing House of Poznan University of Technology",
  address="Poznaň",
  isbn="83-7143-557-6"
}