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BUCHTA, Z.; ŠARBORT, M.; ČÍŽEK, M.; HUCL, V.; ŘEŘUCHA, Š.; PIKÁLEK, T.; DVOŘÁČKOVÁ, Š.; JAN, K.; WEIGL, M.; LAZAR, J.; ČÍP, O.
Original Title
System for automatic gauge block length measurement optimized forsecondary length metrology
English Title
Type
WoS Article
Original Abstract
tThis paper presents a contactless system for automatic gauge blocks calibration based on combination oflaser interferometry and low-coherence interferometry. In the presented system, the contactless mea-surement of the absolute gauge block length is done as a single-step operation without any change inoptical setup during the measurement. The optical setup is combined with compact gauge block changerwith a capacity of 126-ga blocks, which makes the resulting system fully automatic.The paper also presents in detail a set of optimization steps which have been done in order to trans-form the original experimental setup into the automatic system which meets secondary length metrologyrequirements. To prove the measurement traceability, we conducted a set of gauge block length mea-surement comparing data from the optimized system and the established reference systems TESA NPLA.G.I. 300 and TESA–UPC operated in Czech Metrology Institute Laboratory.
English abstract
Keywords
Low-coherence; Interferometry; Laser interferometry;Gauge block; Metrology
Key words in English
Authors
RIV year
2018
Released
24.03.2017
ISBN
0141-6359
Periodical
PRECISION ENGINEERING-JOURNAL OF THE INTERNATIONAL SOCIETIES FOR PRECISION ENGINEERING AND NANOTECHNOLOGY
Volume
49
Number
State
United States of America
Pages from
322
Pages to
331
Pages count
10
BibTex
@article{BUT139390, author="Zdeněk {Buchta} and Martin {Šarbort} and Martin {Čížek} and Václav {Hucl} and Šimon {Řeřucha} and Tomáš {Pikálek} and Štěpánka {Dvořáčková} and Kůr {Jan} and Martin {Weigl} and Josef {Lazar} and Ondřej {Číp}", title="System for automatic gauge block length measurement optimized forsecondary length metrology", journal="PRECISION ENGINEERING-JOURNAL OF THE INTERNATIONAL SOCIETIES FOR PRECISION ENGINEERING AND NANOTECHNOLOGY", year="2017", volume="49", number="49", pages="322--331", issn="0141-6359" }