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CHOBOLA, Z.; LUŇÁK, M.; VANĚK, J.; DOLENSKÝ, J.; BAŘINKA, R.
Original Title
Low-Frequency Noise Quality Testing of Silicon Concentrator Photovoltaic Cell With Very High Efficiency
English Title
Type
Paper in proceedings (conference paper)
Original Abstract
This paper deals with comparisons of noise spectroscopy and I-V characteristic of silicon concentrator photovoltaic (CPV) cell with very high efficiency. Efficiency reaches to 38%. We studied two groups with different technologies (A and B). Each group had 6 samples. The samples were quality screened using noise analysis. From the measurement results it follows that the noise spectral density related to defects is of 1/f or generationrecombination types. G-r noise and burst noise is not fundamental noise and therefore can by use as quality indicator. For the determination of a possible noise source there was used the microplasma detection method and ESEM displaying.
English abstract
Keywords
Concentrators, Crystalline, Epitaxy, Solar cell, ESEM displaying
Key words in English
Authors
RIV year
2016
Released
18.09.2015
Publisher
WIP
Location
Hamburg
ISBN
3-936338-39-6
Book
Proceedings of 31st European PV Solar Energy Conference and Exhibition
2196-0992
Periodical
EU PVSEC 2014 Proceedings DVD
Volume
1
Number
20515
State
Federal Republic of Germany
Pages from
2449
Pages to
2452
Pages count
4
BibTex
@inproceedings{BUT118906, author="Zdeněk {Chobola} and Miroslav {Luňák} and Jiří {Vaněk} and Jan {Dolenský} and Radim {Bařinka}", title="Low-Frequency Noise Quality Testing of Silicon Concentrator Photovoltaic Cell With Very High Efficiency ", booktitle="Proceedings of 31st European PV Solar Energy Conference and Exhibition", year="2015", journal="EU PVSEC 2014 Proceedings DVD", volume="1", number="20515", pages="2449--2452", publisher="WIP", address="Hamburg", doi="10.4229/EUPVSEC20152015-5BV.4.25", isbn="3-936338-39-6", issn="2196-0992" }