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TOMÁNEK, P.; ŠKARVADA, P.; MACKŮ, R.; SOBOLA, D.; BRÜSTLOVÁ, J.; GRMELA, L.
Original Title
Microscale localization and detection of defects in crystalline silicon solar cells
English Title
Type
Peer-reviewed article not indexed in WoS or Scopus
Original Abstract
Silicon remains the only material that is well-researched in both bulk and thin-film configurations. Monocrystalline silicon solar cells are the photovoltaic devices with highest efficiency, but they content a variety of tiny local defects decreasing the efficiency. So the novel method containing electric and optical measurement is presented.
English abstract
Keywords
defect, silicon, solar cell, localization, detection
Key words in English
Authors
RIV year
2016
Released
17.08.2015
Publisher
DGaO
Location
Erlangen, Německo
ISBN
1614-8436
Periodical
DGaO-PROCEEDINGS
Volume
2015
Number
State
Federal Republic of Germany
Pages from
1
Pages to
2
Pages count
URL
http://www.dgao-proceedings.de
BibTex
@article{BUT116796, author="Pavel {Tománek} and Pavel {Škarvada} and Robert {Macků} and Dinara {Sobola} and Jitka {Brüstlová} and Lubomír {Grmela}", title="Microscale localization and detection of defects in crystalline silicon solar cells", journal="DGaO-PROCEEDINGS", year="2015", volume="2015", number="2015", pages="1--2", issn="1614-8436", url="http://www.dgao-proceedings.de" }