Publication result detail

Scanning Probe Microscopy in Technology of Solar Cells Production

MOJROVÁ, B.; BAŘINKOVÁ, P.; BOUŠEK, J.; HÉGR, O.; BAŘINKA, R.; HOFMAN, J.

Original Title

Scanning Probe Microscopy in Technology of Solar Cells Production

English Title

Scanning Probe Microscopy in Technology of Solar Cells Production

Type

Peer-reviewed article not indexed in WoS or Scopus

Original Abstract

This article deals with implementation of SPM techniques (AFM and KPFM) to the characterization of crystalline silicon solar cells.

English abstract

This article deals with implementation of SPM techniques (AFM and KPFM) to the characterization of crystalline silicon solar cells.

Keywords

atomic force microscopy, solar cell, texture, roughness, Kelvin probe force microscopy, back surface field

Key words in English

atomic force microscopy, solar cell, texture, roughness, Kelvin probe force microscopy, back surface field

Authors

MOJROVÁ, B.; BAŘINKOVÁ, P.; BOUŠEK, J.; HÉGR, O.; BAŘINKA, R.; HOFMAN, J.

Released

05.12.2014

Publisher

ElectroScope

Location

Plzeň

ISBN

1802-4564

Periodical

ElectroScope - http://www.electroscope.zcu.cz

Volume

2014

Number

3

State

Czech Republic

Pages from

1

Pages to

6

Pages count

6

URL

http://www.electroscope.zcu.cz

BibTex

@article{BUT111341,
  author="Barbora {Mojrová} and Pavlína {Bařinková} and Jaroslav {Boušek} and Ondřej {Hégr} and Radim {Bařinka} and Jiří {Hofman}",
  title="Scanning Probe Microscopy in Technology of Solar Cells Production",
  journal="ElectroScope - http://www.electroscope.zcu.cz",
  year="2014",
  volume="2014",
  number="3",
  pages="1--6",
  issn="1802-4564",
  url="http://www.electroscope.zcu.cz"
}