Publication result detail

Artifact removal by local extrema detection in images from electron microscopy

KASPAR, P.

Original Title

Artifact removal by local extrema detection in images from electron microscopy

English Title

Artifact removal by local extrema detection in images from electron microscopy

Type

Paper in proceedings (conference paper)

Original Abstract

Processing of images from electron microscopy is important for a succesful analysis of acquired output. As with the majority of digital signals, these are plagued by various types of noise or artifacts. This paper concerns the detection and removal of artifacts created by sample contamination and the following reverse edge detection for displaying image segmentation.

English abstract

Processing of images from electron microscopy is important for a succesful analysis of acquired output. As with the majority of digital signals, these are plagued by various types of noise or artifacts. This paper concerns the detection and removal of artifacts created by sample contamination and the following reverse edge detection for displaying image segmentation.

Keywords

LEEM, artifact detection, artifact removal, edge detection

Key words in English

LEEM, artifact detection, artifact removal, edge detection

Authors

KASPAR, P.

Released

24.04.2014

Publisher

LITERA

Location

Tábor 43a, 612 00, Brno

ISBN

978-80-214-4922-0

Book

STUDENT EEICT, Proceedings of the 20th conference, Volume 3

Pages from

31

Pages to

35

Pages count

5

BibTex

@inproceedings{BUT108866,
  author="Pavel {Kaspar}",
  title="Artifact removal by local extrema detection in images from electron microscopy",
  booktitle="STUDENT EEICT, Proceedings of the 20th conference, Volume 3",
  year="2014",
  number="1",
  pages="31--35",
  publisher="LITERA",
  address="Tábor 43a, 612 00, Brno",
  isbn="978-80-214-4922-0"
}