Publication result detail

Light beam induced voltage (LBIV),low frequency nooise and DLTS as silicon solar cell characterization tools

CHOBOLA, Z., IBRAHIM, A., RŮŽIČKA, Z.

Original Title

Light beam induced voltage (LBIV),low frequency nooise and DLTS as silicon solar cell characterization tools

English Title

Light beam induced voltage (LBIV),low frequency nooise and DLTS as silicon solar cell characterization tools

Type

Paper in proceedings (conference paper)

Original Abstract

Light beam induced voltage (LBIV),low frequency nooise and DLTS as silicon solar cell characterization tools

English abstract

Light beam induced voltage (LBIV),low frequency nooise and DLTS as silicon solar cell characterization tools

Key words in English

Light beam induced

Authors

CHOBOLA, Z., IBRAHIM, A., RŮŽIČKA, Z.

Released

01.01.2001

Publisher

University of technology

Location

Portorož

Book

Proceedings of the 6th International Conference of Slovenian Society for Non-destructive Testing

Pages from

335

Pages count

27

BibTex

@inproceedings{BUT10624,
  author="Zdeněk {Chobola} and Ali {Ibrahim} and Zdeněk {Růžička}",
  title="Light beam induced voltage (LBIV),low frequency nooise and DLTS as silicon solar cell characterization tools",
  booktitle="Proceedings of the 6th International Conference of Slovenian Society for Non-destructive Testing",
  year="2001",
  pages="27",
  publisher="University of technology",
  address="Portorož"
}