Publication result detail

Temperature dependence of 1/f noise and transport characteristics as a nondestructive testing of monocrystalline silicon solar cells

IBRAHIM, A., CHOBOLA, Z.

Original Title

Temperature dependence of 1/f noise and transport characteristics as a nondestructive testing of monocrystalline silicon solar cells

English Title

Temperature dependence of 1/f noise and transport characteristics as a nondestructive testing of monocrystalline silicon solar cells

Type

Paper in proceedings (conference paper)

Original Abstract

Temperature dependence of 1/f noise and transport characteristics as a nondestructive testing of monocrystalline silicon solar cells

English abstract

Temperature dependence of 1/f noise and transport characteristics as a nondestructive testing of monocrystalline silicon solar cells

Key words in English

Temperature dependence

Authors

IBRAHIM, A., CHOBOLA, Z.

Released

15.10.2000

Publisher

University of Tochnology

Location

Roma

Book

Proceedings of 15th World Conference on Non-Destructive Testing

Pages from

231

Pages count

5

BibTex

@inproceedings{BUT10619,
  author="Ali {Ibrahim} and Zdeněk {Chobola}",
  title="Temperature dependence of 1/f noise and transport characteristics as a nondestructive testing of monocrystalline silicon solar cells",
  booktitle="Proceedings of 15th World Conference on Non-Destructive Testing",
  year="2000",
  pages="5",
  publisher="University of Tochnology",
  address="Roma"
}