Publication result detail

Vanishing Points in Point-to-Line Mappings and Other Line Parameterizations

HAVEL, J.; HEROUT, A.; JURÁNKOVÁ, M.

Original Title

Vanishing Points in Point-to-Line Mappings and Other Line Parameterizations

English Title

Vanishing Points in Point-to-Line Mappings and Other Line Parameterizations

Type

Peer-reviewed article not indexed in WoS or Scopus

Original Abstract

Some variants of the Hough transform can be used for detecting vanishing points and groups of concurrent lines. This article addresses a common misconception that in the polar line parameterization the vanishing point is represented by a line. The numerical error caused by this inaccuracy is then estimated.

The article studies in detail point-to-line-mappings (PTLMs) -- a class of line parameterizations which have the property that the vanishing point is represented by a line (and thus can be easily searched for). When a PTLM parameterization is used for the straight line detection by the Hough transform, a pair or a triplet of complementary PTLMs has to be used in order to obtain a limited Hough space. The complementary pairs and triplets of PTLMs are formalized and discussed in this article.

English abstract

Some variants of the Hough transform can be used for detecting vanishing points and groups of concurrent lines. This article addresses a common misconception that in the polar line parameterization the vanishing point is represented by a line. The numerical error caused by this inaccuracy is then estimated.

The article studies in detail point-to-line-mappings (PTLMs) -- a class of line parameterizations which have the property that the vanishing point is represented by a line (and thus can be easily searched for). When a PTLM parameterization is used for the straight line detection by the Hough transform, a pair or a triplet of complementary PTLMs has to be used in order to obtain a limited Hough space. The complementary pairs and triplets of PTLMs are formalized and discussed in this article.

Keywords

line parameterization, Hough transform, vanishing points, camera calibration

Key words in English

line parameterization, Hough transform, vanishing points, camera calibration

Authors

HAVEL, J.; HEROUT, A.; JURÁNKOVÁ, M.

RIV year

2014

Released

18.01.2013

ISBN

0167-8655

Periodical

Pattern Recognition Letters

Volume

2013

Number

34

State

Kingdom of the Netherlands

Pages from

703

Pages to

708

Pages count

6

BibTex

@article{BUT103449,
  author="Jiří {Havel} and Adam {Herout} and Markéta {Juránková}",
  title="Vanishing Points in Point-to-Line Mappings and Other Line Parameterizations",
  journal="Pattern Recognition Letters",
  year="2013",
  volume="2013",
  number="34",
  pages="703--708",
  doi="10.1016/j.patrec.2013.01.020",
  issn="0167-8655"
}