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KLÍMA, M.; PSOTA, B.; SZENDIUCH, I.
Original Title
Compatibility of through-hole technology devices with low-temperature co-fired ceramic substrate
English Title
Type
Peer-reviewed article not indexed in WoS or Scopus
Original Abstract
The article is focused on usage of the through-hole technology (THT) devices on low-temperature co-fired ceramic (LTCC) substrate. This usage is not common, therefore the main aim of this work is finding out the compatibility between LTCC substrate and a structure of device's lead, solder and thick-film paste. Two arrangements of through-hole metallization were used - printing and hole-filling. The most important results are establishment of reliable assembly process and thermal stress strength for finding the possibility of high temperature application. This is found out by ANSYS software simulation and temperature cycling. Defects caused by temperature cycling were studied optically using micro-cuts.
English abstract
Keywords
LTCC, THT, device, joint, reliability.
Key words in English
Authors
RIV year
2014
Released
12.05.2013
Location
Rumunsko
ISBN
2161-2528
Periodical
Conference proceedings (International Spring Seminar on Electronics Technology)
Volume
36
Number
2013
State
United States of America
Pages from
127
Pages to
131
Pages count
5
BibTex
@article{BUT102803, author="Martin {Klíma} and Boleslav {Psota} and Ivan {Szendiuch}", title="Compatibility of through-hole technology devices with low-temperature co-fired ceramic substrate", journal="Conference proceedings (International Spring Seminar on Electronics Technology)", year="2013", volume="36", number="2013", pages="127--131", doi="10.1109/ISSE.2013.6648228", issn="2161-2528" }