Publication result detail

The Formal Approach to the RTL Test Application Problem Using Petri Nets

RŮŽIČKA, R.

Original Title

The Formal Approach to the RTL Test Application Problem Using Petri Nets

English Title

The Formal Approach to the RTL Test Application Problem Using Petri Nets

Type

Paper in proceedings outside WoS and Scopus

Original Abstract

An approach to solve the test application problem is presented. On the basis of RT-level digital circuit formal model, properties of circuit elements, which are important for test controller synthesis, are discussed. Algorithm to extract such information from the model of the circuit and algorithm to create a model of test application to the selected circuit element are presented. To evaluate the relevance of given path for diagnostic data and possibility of parallelism, Petri Nets concept is used.

English abstract

An approach to solve the test application problem is presented. On the basis of RT-level digital circuit formal model, properties of circuit elements, which are important for test controller synthesis, are discussed. Algorithm to extract such information from the model of the circuit and algorithm to create a model of test application to the selected circuit element are presented. To evaluate the relevance of given path for diagnostic data and possibility of parallelism, Petri Nets concept is used.

Keywords

Design for Testability, Testability Analysis, Test Application Problem, Petri Nets

Key words in English

Design for Testability, Testability Analysis, Test Application Problem, Petri Nets

Authors

RŮŽIČKA, R.

Released

17.04.2002

Publisher

Faculty of Information Technology BUT

Location

Brno

ISBN

80-214-2094-4

Book

Proceedings of IEEE Design and Diagnostics of Electronic Circuits and Systems 2002

Pages from

78

Pages to

86

Pages count

9

BibTex

@inproceedings{BUT10023,
  author="Richard {Růžička}",
  title="The Formal Approach to the RTL Test Application Problem Using Petri Nets",
  booktitle="Proceedings of IEEE Design and Diagnostics of Electronic Circuits and Systems 2002",
  year="2002",
  pages="78--86",
  publisher="Faculty of Information Technology BUT",
  address="Brno",
  isbn="80-214-2094-4"
}