Preparation, characterization and testing of new single-crystals, especially for scintillation detectors in electron microscopy and lasers will be the main aim of this sub-project. The characterization will help to establish their approved production technology and will lead to a better quality and yield of the single-crystal production. For lasers, materials with improved purity of the crystalline surfaces necessary for their diffusion bonding will be created; for scintillation detectors, materials with new composition will be created in effort to reduce the scintillation decay and increase the scintillation efficiency. This will improve main parameters of present scintillation detectors, such as the dynamic range and contrast. Optimized ITO grid coatings will ensure the improvement of these parameters for the low-energy electron detection.

Keywords
electron microscopy;crystals;cathodoluminescence;SIMS;XPS;LEIS