NODITO No. 7942

English

Šikula Josef, prof. Ing. RNDr., DrSc. - principal person responsible

Institute of Physics
- responsible department (6.12.2004 - not assigned)
Institute of Physics
- beneficiary (6.12.2004 - not assigned)

CHOBOLA, Z., ŠIKULA, J., VAŠINA, P., PAZDERA, L., JURÁNKOVÁ, V., ŘEHÁK, D. Analysis of Noise Properitef of R1 Solar Cells. In Proceedings of the International NODITO Workshop. Brno: University of Technology, 1995. 3 p. ISBN: 80-214-0663-1.
Detail

CHOBOLA, Z., HRUŠKA, P., PAZDERA, L., JURÁNKOVÁ, V., ŠIKULA, J. Noise Reliability Indicators for Solar Cells. In Procedings of Second ELEN conerence. Grenoble: University of Technology, 1995. 6 p.
Detail

CHOBOLA, Z. Non-destructive testing of contact on GaSb substratcs. In Proceedings of Workshop 97. Slovakia: University of Technology, 1997. 4 p. ISBN: 80-227-0957-3.
Detail

CHOBOLA, Z., VAŠINA, P., ŠIKULA, J. RTS Noise in Integrated Circuits. In Proceedings of the 12th International Conference on Noise in Physical Systems and 1/f Fluctuations. Missouri USA: University of Technology, 1993. 4 p. ISBN: 96-305-5778-9.
Detail

CHOBOLA, Z., JURÁNKOVÁ, V. Noise and DlTS in LEDs. In Proceedings of Workshop 97. Praha: University of Technology, 1997. 2 p.
Detail

CHOBOLA, Z., VAŠINA, P., ŠIKULA, J., JURÁNKOVÁ, V., SIMOEN, E. 1/f Noise and DLTS in LEDS. In Proceedings Third ELEN Workshop Leuven. Belgium: University of Technology, 1996. 5 p.
Detail

CHOBOLA, Z. RTS šum v integrovaných obvodech MH54ALS153. In Knižnice odborných a vědeckých spisů VUT. Brno: Technická universita v Brně, 1994. 4 s. ISBN: 80-214-0560-0.
Detail

CHOBOLA, Z.; ŠIKULA, J.; VAŠINA, P. Application of Frequency Inspection to Assessing the Condition of Fired Roofing Tiles Manufactured Using and LD Technology. In Noise in Physics Systems. 0. St. Luis, USA: University of Missouri, 1989. 4 s.
Detail

CHOBOLA, Z., JURÁNKOVÁ, V. Random current impulses in high-tension bushings. In Proceedings of Workshop 97. Praha: University of Technology, 1997. 2 p.
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CHOBOLA, Z., PAZDERA, L., ŠIKULA, J., VAŠINA, P. Noise in NiPt Schottky Diodes. In Proceedings of ELEN Workshop. Montpellier: University of technology, 1994. 7 p.
Detail

CHOBOLA, Z. Non-destructive testing of contacts on GaAs substrates. In Proceedings of Workshop 97. Praha: University of Technology, 1997. 2 p.
Detail

CHOBOLA, Z., JURÁNKOVÁ, V., IBRAHIM, A. Non-destructive testing of solar cells. In Proceedings of Workshop 97. Praha: University of Technology, 1997. 2 p.
Detail

Responsibility: Šikula Josef, prof. Ing. RNDr., DrSc.