Course detail

Theory of Measurements, Measurement Techniques and Technical Diagnostics

FSI-9TTDAcad. year: 2023/2024

The course introduces students to the theory of advanced measurement techniques and measuring systems with nanometer resolution.

Language of instruction


Number of ECTS credits


Mode of study

Not applicable.

Entry knowledge

Successful completion of the course is conditional on the knowledge and skills acquired in the courses "Physics I", "Physics II", "Metrological Physics".

Rules for evaluation and completion of the course

An examination composed from oral and written part.
Participation at every course parts.


Describe physical principles of selected measuring methods and measuring equipments.
Understanding of selected physical principles and their application in measurements, sensors and equipments.

Study aids

Not applicable.

Prerequisites and corequisites

Not applicable.

Basic literature

DOEBELIN, O.D.: Measurement Systems. Application and Design.. New York: McGraw-Hill, 1990. (EN)
ORNATSKIJ, P.P.: Teoretičeskije osnovy informacionno-izměritělnoj techniki. Kijev: Vyšča škola, 1976.
Normy: Mezinárodní slovník základních a všeobecných termínů v metrologii.. ČSN 01 0115
BOX, G.E.P., HUNTER, W.G., HUNTER, J.S. Statistics for Experiments-an Introduction to Design, Data Analysis and Model Building, Wiley 1978 (EN)
RIPKA, P.; TIPEK, A. Master Book of Sensors, part A, part B, Czech Technical University, 2003 (EN)
WIESENDAGER. R., GUNTHERODT. J.H.: Scanning Tuneling Microscopy II, Springer 1995 (EN)
REIMER, L, Scanning Electron Microscopy (2nd ed.), Springer,1998 (EN)
WILIAMS, D. B., CARTER, C. B. Transmission Electron Microscopy (2nd ed.), Springer, 2009 (EN)

Recommended reading

DOEBELIN, O.D.: Measurement Systems. Application and Design.. New York: McGraw-Hill, 1990. (EN)
Normy: Vyjadřování nejistoty při měření.
JENČÍK, J., KUHN, L. a další: Technická měření ve strojírenství.. Praha: SNTL, 1982.

Classification of course in study plans

  • Programme D-APM-K Doctoral, 1. year of study, winter semester, recommended
  • Programme D-APM-P Doctoral, 1. year of study, winter semester, recommended

Type of course unit



20 hours, optionally

Teacher / Lecturer


General definitions and theory. Statistics and data processing: classification of random parameters (Gaussian and uniform distribution). Law of error propagation. Experimental data processing.

Sensors: general classification, capacity sensors, sensors based on induction.

Advanced methods of visualisation and diagnostics: scanning electron microscopy, atomic force microscopy, scanning tunnelling microscopy.