Course detail

Microelectronic Devices and Structures

FEKT-MPA-MPRAcad. year: 2021/2022

Fundamental building blocks of microelectronic structures.

Language of instruction


Number of ECTS credits


Mode of study

Not applicable.

Learning outcomes of the course unit

By means of written and oral examination is verified that the student is able to:

Explain the physical nature of the semiconductor materials.
Explain the physical nature of abrupt PN junction;
Enumerate the main parameters of the PN junction and their properties;
Explain voltage breakdown of PN junction;
Describe the principle of metal-semiconductor junction and Schottky´s effect;
Enumerate physical mechanisms of transport of electric charge through a metal-semiconductor junction;
Describe the differences between the PN junction and metal-semiconductor junction;
Enumerate the types of heterojunctions;
Enumerate the physical mechanisms of transport of electric charge through the junction;
Explain the concepts of lattice-matched and lattice-mismatched heterojunctions,
Define and explain terms coherently grown layers and the critical layer thickness;
Explain the principle of the bipolar transistor;
Describe the components of the emitter, collector and base current;
Explain the parameters of BT in the active normal mode (emitter injection efficiency, base transport factor);
Define current gain in Common Base configuration and current gain in Common Emitter configuration;
Describe the operation of BT in high injection mode;
Draw and describe the typical structure of BT with EB heterojunction;
Explain the terms: graded base and quasi-electrical field at heterostructure BT;
Draw and describe the MIS structure;
Enumerate the conditions for an ideal MIS structure;
Draw the energy band diagram of MIS structures and explain the terms: Fermi potential, Intrinsic potential, Volume potential and Surface potential;
Describe the characteristics of the oxide layer structure of MIS structure;
Draw and describe the structure of MOSFET;
Draw and describe operation of MOSFET structure in following modes: linear mode, the transition to saturation mode, saturation mode;
Define the terms “Short channel MOSFET transistor” and “Long channel MOSFET transistor”;
Describe the physical phenomena that occur in a short channel transistor;
Draw and describe the differences between the structure of the transistor with short and long channels;
Explain the principle of charge sparing model and its importance in reducing threshold voltage of the transistor with short channel;
Explain the concept of hot electrons and describe phenomena originated by these electrons;
Describe the principle of the transistor with ferromagnetic gate.


The subject knowledge on the Bachelor´s degree level is requested.


Not applicable.

Planned learning activities and teaching methods

Techning methods include lectures and excercises.

Assesment methods and criteria linked to learning outcomes

Students are assessed in this layout:

10 points - work in exercises
20 points - midterm test knowledge of exercises and lectures
70 points - a combination of written and oral exams

Detailed requirements for completion of a course are specified by a regulation issued by the lecturer responsible for the course and updated for every.

Course curriculum

1. Přehled fyziky polovodičů.
2. Základy kvantové elektroniky.
3. Přechod PN a polovodičové diody.
4. Kontakt kov-polovodič, Schottkyho diody, ohmické kontakty.
5. Heteropřechody a supermřížky.
6. Bipolární tranzistor s homogenními přechody.
7. Bipolární tranzistor s heteropřechody.
8. Struktura MIS a její vlastnosti.
9. Tranzistor MOSFET, struktury CMOS.
10. Moderní typy tranzistorů FET.
11. Elektroluminiscenční a laserové diody.
12. Amorfní a polykrystalické polovodiče.
13. Organické polovodiče a molekulární elektronika.

Work placements

Not applicable.


Detailed investigation of structures and properties of microelectronic devices, their physical and circuit models.
Detailed investigation of device models, their parameters and applicability.

Specification of controlled education, way of implementation and compensation for absences

The content and forms of instruction in the evaluated course are specified by a regulation issued by the lecturer responsible for the course and updated for every academic year.

Recommended optional programme components

Not applicable.

Prerequisites and corequisites

Not applicable.

Basic literature

Barnham K., Vvedensky D.: Low-Dimensional Semiconductor Structures: Fundamentals and Device Applications, Cambridge University Press; 1st edition, 2001, ISBN: 0521591031 (EN)
Böer, K., W., Pohl, U., W.: Semiconductor Physics, Springer; 1st edition, 2018, ISBN: 978-3319691480 (EN)
Neamen, D., A., Biswas, D.: Semiconductor Physics and Devices, MC GRAW HILL INDIA; 4 edition, 2013, ISBN: 978-0071070102 (EN)

Recommended reading

Not applicable.

Classification of course in study plans

  • Programme MPA-MEL Master's, 1. year of study, winter semester, compulsory-optional
  • Programme MPAD-MEL Master's, 1. year of study, winter semester, compulsory-optional

Type of course unit



26 hours, optionally

Teacher / Lecturer


1. Semiconductor physics: Brief review
2. PN junction, semiconductor diodes.
3. Metal-semiconductor junction, Schottky diodes, ohmic contacts.
4. Heterojunctions, superlattices.
5. Bipolar junction transistor.
6. Heterojunction bipolar transistor.
7. MIS structure.
8. Transistor MOSFET, CMOS structures.
9. Modern field effect transistors.
10. Transistor HEMT.
11. Light emitting diodes, semiconductor lasers.
12. New physical phenomena and related structures.
13. Time reserve.

Sze S. M., Ng K. K.: Physics of Semiconductor Devices. Wiley, 2006.
Sze S. M., Chang C. Y.: ULSI Devices, Wiley, 2000.
Hess K.: Advanced Theory of Semiconductor Devices. Wiley, 2000.
Liu J.: Photonic Devices. Cambridge University Press, 2005.
Brennan K. F., Brown A. S.: Theory of Modern Semiconductor Devices. Wiley 2002.

Fundamentals seminar

13 hours, optionally

Teacher / Lecturer


1. Band diagram of semiconductor structures, charge carriers concentration.
2. Extraction of pn-diode parameters from I-V characteristics.
3. Semiconductor diode as analog switch.
4. Barrier capacitance of semiconductor diode.
5. Extraction of Schottky diode parameters from I-V characteristics.
6. Extraction of diode parameters from C-V characteristics.
7. Diode structures in integrated circuits.
8. Bipolar junction transistor: structures and parameters.
9. Test
10. MOSFET: structures and parameters.
11. Analog applications of MOSFET: analog switch, active load.
12. Digital application of MOSFET: CMOS gate.
13. Light emitting diodes: structures and parameters.

Exercise in computer lab

26 hours, compulsory

Teacher / Lecturer