Course detail

Diagnostics and measurements of functional properties of nanostructures

CEITEC VUT-DS102AAcad. year: 2019/2020

The main goal of this PhD course is to give a theoretical and experimental background on the methods for diagnostics of nanostructures available in CEITEC. The subject is aimed at the explanation of physical principles of diagnostics of 1D and 2D nanostructures suitable for a study of morphological, chemical and structural parameters, as well as of their local functional properties. Various modes of scanning probe microscopy, electron and ion microscopy (TEM, SEM, etc.), optical spectroscopic microscopy and their combination will be discussed. Most of these methods will be demonstrated and practice on instruments of CEITEC facilities.

Language of instruction

English

Mode of study

Not applicable.

Guarantor

prof. RNDr. Tomáš Šikola, CSc.

Department

Central European Institute of Technology BUT (CEITEC VUT)

Learning outcomes of the course unit

Not applicable.

Prerequisites

Not applicable.

Co-requisites

Not applicable.

Planned learning activities and teaching methods

Not applicable.

Assesment methods and criteria linked to learning outcomes

Not applicable.

Course curriculum

1. Scanning Probe Microscopy (SPM) – introduction, principles of design.
2. Scanning Tunneling Microscopy (STM) – principles of imaging by tunneling current and operation modes; scanning force microscopy (SFM) – relevant forces and operation modes.
3. Atomic force microscopy (AFM) and magnetic force microscopy (MFM).
4. Electric force microscopy (EFM) and Kelvin force microscopy (KFM).
5. Other types of SPM.
6. Electron microscopy and spectroscopy (TEM/EELS, SEM, SAM, EDX, SEMPA, aj.).
7. Ion microscopy and spectroscopy (FIB/LEIS, SIMS).
8. Photoelectron microscopy (XPS, SR PES, (S)AR XPS).
9. Optical microscopy and spectroscopy - far field methods (reflectivity and ellipsometry, confocal scanning Raman spectroscopy and photoluminiscence, two-photon methods).
10. Optical microscopy and spectroscopy - near field methods (scanning near field optical microscopy - SNOM).
11. Optical microscopy and spectroscopy - combined methods (scanning tunneling luniniscence, cathodoluminiscence, TERS and SERS, etc.).
12. X-ray methods (XRD, XRR, SAXS, GISAXS, XRCD/PEEM microscopy) .

Work placements

Not applicable.

Aims

Not applicable.

Specification of controlled education, way of implementation and compensation for absences

Not applicable.

Recommended optional programme components

Not applicable.

Prerequisites and corequisites

Not applicable.

Basic literature

Meyer E., Hug H. J.: Scanning Probe Microscopy, The Lab on a Tip, Springer , 2004
Novotny L. and Hecht B.:Principles of Nano-Optics, Cambridge University Press, 2006
Stroscio A., Keiser W. J.: Scanning Tunneling Microscopy, Academic Press, Inc., 1993

VUT

Faculties

University Institutes

Parts

Diagnostics and measurements of functional properties of nanostructures