Course detail

Diagnostics and Testing of Electronic Systems

FEKT-BDTSAcad. year: 2017/2018

Diagnosis and testing of electronic circuits. Failure modes. Detection and fault location. Failure classification and mechanisms of disorders. Diagnostic system. Physical methods of technical diagnostics. Functional methods of technical diagnostics. Diagnosing analog circuits. Diagnosis of digital circuits. Built-in test systems, boundary scan, logic analyzers. Designing circuits for testability and diagnostic ability.

Learning outcomes of the course unit

Student is skilled on the basic terminology used in the field of technical diagnostics after successful completion of the course . Student understands the difference between physical and functional diagnostic methods. He knows the possible causes of measurement errors of electrical circuits and knows how to prevent them. Understands the principle on which it is based JTAG test interface. Can name the principles of electronic systems for ease of diagnostc ability.


The subject knowledge on the secondary school level is required.


Not applicable.

Recommended optional programme components

Not applicable.

Recommended or required reading

Loveday,G.C.: Electronic testing and fault diagnosis, Longman, 1995 (EN)
Lenk,J.D.: McGraw-Hill electronic troubleshooting handbook, McGraw-Hill, 1995 (EN)
Pain,R.: Practical electronic fault finding and troubleshooting, Newnes, 1995 (EN)
Bushnell M.L., Agrawal V. D.: Essentials of Electronic Testing, Kluwer Academic Publishers, Boston, 2000 (EN)
Hurst L.S.: VLSI testing, The Institution of EE, London, 1998 (EN)
Miczo A.: Digital Logic Testing and Simulation, Wiley-Interscience, Hoboken,N.J., 2003 (EN)
Mourad S.: Principles of Testing Electronic Systems, John Wiley & Sons Inc., New York, 2000 (EN)
Segura J., Hawkins Ch.F.: CMOS Electronics How It Works, How It Fails, IEEE Inc., 2004 (EN)
Burns M., Roberts G.W.: An Introduction to Mixed-Signal IC test and Measurement, Oxford University Press, 2001 (EN)
Kuo J.B., Lou J.: Low-Voltage CMOS VLSI Circuits, John Wiley & Sons, 1999 (EN)
Uyemura J.P.: Introduction to VLSI Circuits and Systems, John Wiley & Sons, 2002 (EN)
Kwok K.N.: Complete Guide To Semiconductor Devices, Mc Graw-Hill Inc., 1995 (EN)
MUSIL, V.,RECMAN, M., PROKOP, R. Diagnostika a testování elektronických systémů_S. ISBN MEL105. (skripta) (CS)
MUSIL, V., RECMAN, M., PROKOP, R. Diagnostika a testování elektronickýých systémů_P. ISBN MEL107. (skripta) (CS)
MUSIL, V., RECMAN, M., PROKOP, R. Diagnostika a testování elektronických systémů_L. ISBN MEL106. (skripta) (CS)

Planned learning activities and teaching methods

Teaching methods include lecture and laboratory excercises.

Assesment methods and criteria linked to learning outcomes

laboratory exercises .................. 20 points
activity ........................................ 8 points
semestral test ............................. 12 points
final test ...................................... 70 points

Language of instruction


Work placements

Not applicable.

Course curriculum

Introduction to technical diagnostics, basic terminology
Failure classification of electronic components, integrated circuits
Methods for diagnosing ELT. equipment
Measurement errors and their causes
Practical examples of diagnosis of electrical circuits
The feedback systems (sources, amplifiers), stability
Practical examples of diagnostic feedback circuit
Diagnosis and testing of digital circuits. Faults in logic circuits. Diagnosing faults in logic systems, modeling faults, testing of logic circuits, Boolean difference, creating tests for combinational circuits.
Built-in test systems (BIST) and Boundary Scan (JTAG)
Diagnosing analog signals
Proposal with regard to diagnostic ability, testing embedded systems - Development Models


To acquaint students with the basic concepts of technical diagnostics, to explain the differences between physical and functional approaches to diagnosis, clarify issues sources of errors that can occur during measurement and how to prevent them, get to know the basic methods of testing electrical blocks vestavětného familiar with the method of testing and JTAG interface contain, learn with the problems of circuit design for ease of diagnostic ability.

Specification of controlled education, way of implementation and compensation for absences

laboratory exercises

Classification of course in study plans

  • Programme EEKR-B Bachelor's

    branch B-EST , 2. year of study, summer semester, 5 credits, optional interdisciplinary
    branch B-MET , 2. year of study, summer semester, 5 credits, optional specialized

  • Programme EEKR-CZV lifelong learning

    branch ET-CZV , 1. year of study, summer semester, 5 credits, optional specialized

Type of course unit



26 hours, optionally

Teacher / Lecturer

Exercise in computer lab

26 hours, optionally

Teacher / Lecturer