Course detail

Methods and Equipment for Technical Diagnostic

FSI-XTD-KAcad. year: 2015/2016

The course introduces students to the theory of measurement of basic quantities, describes measuring systems and algorithm of data processing.

Language of instruction

Czech

Number of ECTS credits

Mode of study

Not applicable.

Guarantor

doc. Ing. Stanislav Průša, Ph.D.

Department

Institute of Physical Engineering (ÚFI)

Learning outcomes of the course unit

Students will acquire skills and experience with respect to measurement methods, application of sensors, and configurations and functional descriptions of measuring instruments.

Prerequisites

Successful completion of the course is conditional on the knowledge and skills acquired in the courses "Physics I", "Physics II", "Metrological Physics".

Co-requisites

Not applicable.

Planned learning activities and teaching methods

The course is taught through lectures supported by several laboratory experiments.

Assesment methods and criteria linked to learning outcomes

An examination composed from oral and written part. Active participation at laboratory experiments and making valuable reports.

Course curriculum

Not applicable.

Work placements

Not applicable.

Aims

The course focuses on the physical principles of the method of measurement, on understanding of the operating principles of measurement hardware and on the problems encountered in the analysis, design, and application of such equipment.

Specification of controlled education, way of implementation and compensation for absences

Attendance at seminars in labs is required.

Recommended optional programme components

Not applicable.

Prerequisites and corequisites

Not applicable.

Basic literature

ANTHONY, D.M. Engineering Metrology. New York: Pergamon Press, 1987.
DOEBELIN, O.D. Measurement Systems. Application and Design. 4. vydání. New York: McGraw-Hill, 1990. 960 s. ISMN 0-07-100697-4.
ORNATSKIJ, P.P. Teoretičeskije osnovy informacionno-izměritělnoj techniki. Kijev: Vyšča škola, 1976. 431 s.
SERWAY, R.A. and BEICHNER, R.J. Physics for Scientist and Engineers with Modern Physics. 5. vydání. Orlando: Saunders College Publisching, 2000. 1551 s.

Recommended reading

DOEBELIN, O.D. Measurement Systems. Application and Design. 4. vydání. New York: McGraw-Hill, 1990. 960 s. ISMN 0-07-100697-4.
Električeskije izměrenija nelekričeskich veličin. P.V. Novickij, ed. Leningrad: Energie, 1075. 575 s.
HALLIDAY, D., RESNICK, R. and WALKER, J. Fyzika. 1198 s. Brno-Praha:VUTIUM-PROMETHEUS, 2000. Přeloženo z: Fundamentals of Physics, 5.vydání: Wiley,1997 (s přihlédnutím ke změnám pro 6. vydání pro rok 2001).
JENČÍK, J., KUHN, L. a další. Technická měření ve strojírenství. Praha: SNTL, 1982. 580 s.

Classification of course in study plans

  • Programme N2301-2 Master's

    branch M-KSB , 2 year of study, summer semester, compulsory

Type of course unit

 

Guided consultation

4 hod., optionally

Teacher / Lecturer

doc. Ing. Stanislav Průša, Ph.D.

Syllabus

General definitions and theory: Measuring systems characteristics. Nonlinearity of measuring systems. Expansion of linearity.
Statistics and data processing: classification of random parameters (Gaussian and uniform distribution). Measuring uncertainty. Law of error propagation. Experimental data processing.
Sensors: general classification, capacity sensors, sensors based on induction.
Advanced methods of visualisation and diagnostics: Michalson interferometry, X-ray diffraction, scanning electron microscopy, atomic force microscopy, scanning tunnelling microscopy.

Laboratory exercise

9 hod., compulsory

Teacher / Lecturer

Ing. David Prochazka, Ph.D.

Syllabus

Polarization
Diffraction
Photometry
Wire optics
LCD display
Solar cell characterization
Computer tomography for industry
LIBS – ablation using pulsed LASER beams
SEM – Scanning Electron Microscopy
AFM - Atomic Force Microscopy
STM – Scanning Tunneling Microscopy