Course detail
Methods and Equipment for Technical Diagnostic
FSI-XTDAcad. year: 2015/2016
The course introduces students to the theory of measurement of basic quantities, describes measuring systems and algorithm of data processing.
Language of instruction
Czech
Number of ECTS credits
4
Mode of study
Not applicable.
Guarantor
Department
Learning outcomes of the course unit
Students will acquire skills and experience with respect to measurement methods, application of sensors, and configurations and functional descriptions of measuring instruments.
Prerequisites
Successful completion of the course is conditional on the knowledge and skills acquired in the courses "Physics I", "Physics II", "Metrological Physics".
Co-requisites
Electromagnetic field theory.
Planned learning activities and teaching methods
The course is taught through lectures supported by several laboratory experiments.
Assesment methods and criteria linked to learning outcomes
An examination composed from oral and written part. Active participation at laboratory experiments and making valuable reports.
Course curriculum
Not applicable.
Work placements
Not applicable.
Aims
The course focuses on the physical principles of the method of measurement, on understanding of the operating principles of measurement hardware and on the problems encountered in the analysis, design, and application of such equipment.
Specification of controlled education, way of implementation and compensation for absences
Attendance at seminars in labs is required.
Recommended optional programme components
Not applicable.
Prerequisites and corequisites
Not applicable.
Basic literature
ANTHONY, D.M. Engineering Metrology. New York: Pergamon Press, 1987.
DOEBELIN, O.D. Measurement Systems. Application and Design. 4. vydání. New York: McGraw-Hill, 1990. 960 s. ISMN 0-07-100697-4.
ORNATSKIJ, P.P. Teoretičeskije osnovy informacionno-izměritělnoj techniki. Kijev: Vyšča škola, 1976. 431 s.
SERWAY, R.A. and BEICHNER, R.J. Physics for Scientist and Engineers with Modern Physics. 5. vydání. Orlando: Saunders College Publisching, 2000. 1551 s.
DOEBELIN, O.D. Measurement Systems. Application and Design. 4. vydání. New York: McGraw-Hill, 1990. 960 s. ISMN 0-07-100697-4.
ORNATSKIJ, P.P. Teoretičeskije osnovy informacionno-izměritělnoj techniki. Kijev: Vyšča škola, 1976. 431 s.
SERWAY, R.A. and BEICHNER, R.J. Physics for Scientist and Engineers with Modern Physics. 5. vydání. Orlando: Saunders College Publisching, 2000. 1551 s.
Recommended reading
DOEBELIN, O.D. Measurement Systems. Application and Design. 4. vydání. New York: McGraw-Hill, 1990. 960 s. ISMN 0-07-100697-4.
Električeskije izměrenija nelekričeskich veličin. P.V. Novickij, ed. Leningrad: Energie, 1075. 575 s.
Halliday,D., Resnick,R., Walker,J.: Fyzika. VUTIUM, 2014.
JENČÍK, J., KUHN, L. a další. Technická měření ve strojírenství. Praha: SNTL, 1982. 580 s.
Električeskije izměrenija nelekričeskich veličin. P.V. Novickij, ed. Leningrad: Energie, 1075. 575 s.
Halliday,D., Resnick,R., Walker,J.: Fyzika. VUTIUM, 2014.
JENČÍK, J., KUHN, L. a další. Technická měření ve strojírenství. Praha: SNTL, 1982. 580 s.
Classification of course in study plans
Type of course unit
Lecture
13 hod., optionally
Teacher / Lecturer
Syllabus
General definitions and theory: Measuring systems characteristics. Nonlinearity of measuring systems. Expansion of linearity.
Statistics and data processing: classification of random parameters (Gaussian and uniform distribution). Measuring uncertainty. Law of error propagation. Experimental data processing.
Sensors: general classification, capacity sensors, sensors based on induction.
Advanced methods of visualisation and diagnostics: Michalson interferometry, X-ray diffraction, scanning electron microscopy, atomic force microscopy, scanning tunnelling microscopy.
Statistics and data processing: classification of random parameters (Gaussian and uniform distribution). Measuring uncertainty. Law of error propagation. Experimental data processing.
Sensors: general classification, capacity sensors, sensors based on induction.
Advanced methods of visualisation and diagnostics: Michalson interferometry, X-ray diffraction, scanning electron microscopy, atomic force microscopy, scanning tunnelling microscopy.