Publication detail

Temperature Stabilization of Semiconductor Lasers for Direct Measurement of Index of Refraction of Air

MATOUŠEK, V., ČÍP, O.

Original Title

Temperature Stabilization of Semiconductor Lasers for Direct Measurement of Index of Refraction of Air

Type

conference proceedings

Language

English

Original Abstract

Laser interferometers are even more precise distance measurement devices with resolution in nanometer or sub-nanometer region.

Keywords

Temperature stabilization laser index of refraction of air

Authors

MATOUŠEK, V., ČÍP, O.

Released

1. 1. 2003

Location

BRNO

ISBN

80-214-2379-X

Book

STUDENT EEICT 2003 9th CONFERENCE

Edition number

první

Pages from

480

Pages to

484

Pages count

5

BibTex

@proceedings{BUT64062,
  editor="Vít {Matoušek} and Ondřej {Číp}",
  title="Temperature Stabilization of Semiconductor Lasers for Direct Measurement of Index of Refraction of Air",
  year="2003",
  number="první",
  pages="5",
  address="BRNO",
  isbn="80-214-2379-X"
}