Publication detail

An EMC Susceptibility Study of Integrated Basic Bandgap Voltage Reference Cores

KROLÁK, D. HORSKÝ, P.

Original Title

An EMC Susceptibility Study of Integrated Basic Bandgap Voltage Reference Cores

Type

journal article in Web of Science

Language

English

Original Abstract

This paper presents a comparative EMC susceptibility study of various integrated bandgap voltage reference cores. Conventional well-known bandgap references based on Kuijk, Brokaw and Tsividis concepts with reduced count of bipolar junction transistors in the core were analyzed. On top of the EMC susceptibility comparison, basic parameters like temperature drift, sensitivity to an operational amplifier input offset and line regulation are also discussed. The influence of a collector leakage current compensation at high temperatures is investigated as well.

Keywords

Bandgap voltage reference, Brokaw, BCD, EMC, HF immunity, Kuijk, offset, temperature drift, Tsividis

Authors

KROLÁK, D.; HORSKÝ, P.

Released

16. 8. 2022

Publisher

Radioengineering

Location

Praha, CZ

ISBN

1210-2512

Periodical

Radioengineering

Year of study

31

Number

3

State

Czech Republic

Pages from

413

Pages to

421

Pages count

9

URL

BibTex

@article{BUT172476,
  author="David {Krolák} and Pavel {Horský}",
  title="An EMC Susceptibility Study of Integrated Basic Bandgap Voltage Reference Cores",
  journal="Radioengineering",
  year="2022",
  volume="31",
  number="3",
  pages="413--421",
  doi="10.13164/RE.2022.0413",
  issn="1210-2512",
  url="https://www.radioeng.cz/fulltexts/2022/22_03_0413_0421.pdf"
}