Publication detail

VERIFICATION OF MODELING APPROACH BY USING MODEL OF CALCULABLE CAPACITOR AND DETERMINATION OF ITS ACCURACY

MANCL, V.

Original Title

VERIFICATION OF MODELING APPROACH BY USING MODEL OF CALCULABLE CAPACITOR AND DETERMINATION OF ITS ACCURACY

Type

conference paper

Language

English

Original Abstract

During the creation of any sort of model the inevitable question about the model correctness and accuracy, should always be answered. This paper proposes a simple method for modelers to prove their approach to modeling and to determine the accuracy of a simulation. The method consists of creating a model of calculable capacitor based on Thompson-Lampard theorem in Ansys Electronics desktop using Maxwell 3D electronics desktop. The model and its parts are described. The expected results are discussed and compared to data obtained from simulation. Problematic of rounding edges and its influence on simulation accuracy and time is also discussed and shown on two models. A part of the paper is a description of how to interpret the Ansys percentage error.

Keywords

Ansys Electronics Desktop, Calculable capacitor, Fringe effect, Maxwell 2D and 3D, Model accuracy, Simulation, Thompson-Lampard Theorem

Authors

MANCL, V.

Released

27. 4. 2021

Publisher

Vysoké učení technické v Brně

Location

Brno

ISBN

978-80-214-5943-4

Book

PROCEEDINGS II OF THE 27TH STUDENT EEICT 2021 selected papers

Edition

1

Pages from

176

Pages to

180

Pages count

5

URL

https://www.fekt.vut.cz/conf/EEICT/archiv/sborniky/EEICT_2021_sbornik_1.pdf

BibTex

@inproceedings{BUT171371,
  author="Vlastimil {Mancl}",
  title="VERIFICATION OF MODELING APPROACH BY USING MODEL OF CALCULABLE CAPACITOR AND DETERMINATION OF ITS ACCURACY",
  booktitle="PROCEEDINGS II OF THE 27TH STUDENT EEICT 2021 selected papers",
  year="2021",
  series="1",
  pages="176--180",
  publisher="Vysoké učení technické v Brně",
  address="Brno",
  doi="10.13164/eeict.2021.176",
  isbn="978-80-214-5943-4",
  url="https://www.fekt.vut.cz/conf/EEICT/archiv/sborniky/EEICT_2021_sbornik_1.pdf"
}