Publication detail

Power Consumption Analysis of New Generation of Polymorphic Gates

NEVORAL, J. ŠIMEK, V. RŮŽIČKA, R.

Original Title

Power Consumption Analysis of New Generation of Polymorphic Gates

Type

conference paper

Language

English

Original Abstract

One of the possible ways how to accomplish multifunctional digital circuits follows the paradigm of Polymorphic electronics. Design of such circuits is closely related to the availability of suitable polymorphic gates. Unfortunately, the actual electronic properties of the polymorphic gates published in the past were way too far from matching their conventional CMOS counterparts. A new type of polymorphic gates with significantly better parameters has been recently shown: Gates whose function is determined by the polarity of dedicated supply rails. Such gates have been investigated mostly in terms of their size and propagation delay. In this paper, power consumption of exactly such gates is being analysed. That makes it possible to identify the best variants among them and subsequently compare their properties with conventional CMOS circuits. Furthermore, an extensive gate set consisting of individual polymorphic gates with the lowest power consumption was introduced together with a gate set demonstrating the best found trade-off between gate size, delay and power consumption. Both sets are integrated now into the PoLibSi library - freely available library with polymorphic gates of the new generation.

Keywords

Polymorphic gate, power consumption, PoLibSi, MOSFET, polymorphic electronics

Authors

NEVORAL, J.; ŠIMEK, V.; RŮŽIČKA, R.

Released

1. 4. 2020

Publisher

Institute of Electrical and Electronics Engineers

Location

Novi Sad

ISBN

978-1-7281-9938-2

Book

23rd International Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2020

Pages from

1

Pages to

6

Pages count

6

BibTex

@inproceedings{BUT162271,
  author="Jan {Nevoral} and Václav {Šimek} and Richard {Růžička}",
  title="Power Consumption Analysis of New Generation of Polymorphic Gates",
  booktitle="23rd International Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2020",
  year="2020",
  pages="1--6",
  publisher="Institute of Electrical and Electronics Engineers",
  address="Novi Sad",
  doi="10.1109/DDECS50862.2020.9095579",
  isbn="978-1-7281-9938-2"
}