Publication result detail

Near field photoluminescence and photoreflectance measurements of semiconductor structures

TOMÁNEK, P., BENEŠOVÁ, M., DOBIS, P., GRMELA, L., BRÜSTLOVÁ, J., OTEVŘELOVÁ, D., LÉTAL, P.

Original Title

Near field photoluminescence and photoreflectance measurements of semiconductor structures

English Title

Near field photoluminescence and photoreflectance measurements of semiconductor structures

Type

Paper in proceedings (conference paper)

Original Abstract

We present near-field local photoluminescence, local current and photoreflectance spectroscopic study of semiconductor quantum structures using a technique of reflection scanning near-field optical microscopy (SNOM) in combination with Nitrogen (or Ti:Saphire) laser and dye laser in one arm and He-Ne lasers in the other one.

English abstract

We present near-field local photoluminescence, local current and photoreflectance spectroscopic study of semiconductor quantum structures using a technique of reflection scanning near-field optical microscopy (SNOM) in combination with Nitrogen (or Ti:Saphire) laser and dye laser in one arm and He-Ne lasers in the other one.

Keywords

near field optics, photoreflectance, photoluminescence, lateral resolution

Key words in English

near field optics, photoreflectance, photoluminescence, lateral resolution

Authors

TOMÁNEK, P., BENEŠOVÁ, M., DOBIS, P., GRMELA, L., BRÜSTLOVÁ, J., OTEVŘELOVÁ, D., LÉTAL, P.

Released

03.10.2001

Publisher

MSSI

Location

Limerick

Book

Nanomaterials: Fundamentals and applications

Pages from

59

Pages count

1

BibTex

@inproceedings{BUT6613,
  author="Pavel {Tománek} and Markéta {Benešová} and Pavel {Dobis} and Lubomír {Grmela} and Jitka {Brüstlová} and Dana {Otevřelová} and Petr {Létal}",
  title="Near field photoluminescence and photoreflectance measurements of semiconductor structures",
  booktitle="Nanomaterials: Fundamentals and applications",
  year="2001",
  pages="1",
  publisher="MSSI",
  address="Limerick"
}