Publication result detail

PD MEASUREMENT WITH MICROSENSORS

HAVLÍČEK, T.; BOUŠEK, J.; PAVLÍK, M.

Original Title

PD MEASUREMENT WITH MICROSENSORS

English Title

PD MEASUREMENT WITH MICROSENSORS

Type

Paper in proceedings (conference paper)

Original Abstract

In the present the deep investigation of partial discharge (PD) activity are necessary for longer service life and better reliability of high voltage under stressed parts or of such whole systems or facilities. There is a need of minimal size sensors which can be integrated during the production inside the measured object like high voltage transformers, drivers or high voltage parts of PCB's are, can serve us the valued information about discharge activity during whole service life. This work is focused on design of very small moveable and sensitive sensors.

English abstract

In the present the deep investigation of partial discharge (PD) activity are necessary for longer service life and better reliability of high voltage under stressed parts or of such whole systems or facilities. There is a need of minimal size sensors which can be integrated during the production inside the measured object like high voltage transformers, drivers or high voltage parts of PCB's are, can serve us the valued information about discharge activity during whole service life. This work is focused on design of very small moveable and sensitive sensors.

Keywords

Partial Discharge (PD), PD measurement, PD investigation, sensors, PD location

Key words in English

Partial Discharge (PD), PD measurement, PD investigation, sensors, PD location

Authors

HAVLÍČEK, T.; BOUŠEK, J.; PAVLÍK, M.

RIV year

2010

Released

10.09.2008

Publisher

Z. Novotný

Location

Brno

ISBN

978-80-214-3717-3

Book

Electronic Devices and System IMAPS CS International Conference 2008

Pages from

161

Pages to

165

Pages count

4

BibTex

@inproceedings{BUT26852,
  author="Tomáš {Havlíček} and Jaroslav {Boušek} and Michal {Pavlík}",
  title="PD MEASUREMENT WITH MICROSENSORS",
  booktitle="Electronic Devices and System IMAPS CS International Conference 2008",
  year="2008",
  number="1",
  pages="161--165",
  publisher="Z. Novotný",
  address="Brno",
  isbn="978-80-214-3717-3"
}