Publication detail

Utilizing Genetic Programming to Enhance Polygenic Risk Score Calculation

HURTA, M. SCHWARZEROVÁ, J. NAGELE, T. WECKWERTH, W. PROVAZNÍK, V. SEKANINA, L.

Original Title

Utilizing Genetic Programming to Enhance Polygenic Risk Score Calculation

Type

conference paper

Language

English

Original Abstract

The polygenic risk score has proven to be a valuable tool for assessing an individual's genetic predisposition to phenotype (disease) within biomedicine in recent years. However, traditional regression-based methods for polygenic risk scores calculation have limitations that can impede their accuracy and predictive power. This study introduces an innovative approach to enhance polygenic risk scores calculation through the application of genetic programming. By harnessing the power of genetic programming, we aim to overcome the limitations of traditional regression techniques and improve the accuracy of polygenic risk scores predictions. Specifically, we showed that a polygenic risk score generated through Cartesian genetic programming yielded comparable or even more robust statistical distinctions between groups that we evaluated within three independent case studies.

Keywords

Polygenic risk score, genetic variations, computational biology, genetic programming

Authors

HURTA, M.; SCHWARZEROVÁ, J.; NAGELE, T.; WECKWERTH, W.; PROVAZNÍK, V.; SEKANINA, L.

Released

2. 12. 2023

Publisher

Institute of Electrical and Electronics Engineers

Location

Istanbul

ISBN

979-8-3503-3748-8

Book

2023 IEEE International Conference on Bioinformatics and Biomedicine (BIBM 2023)

Pages from

3782

Pages to

3787

Pages count

6

URL

BibTex

@inproceedings{BUT185638,
  author="Martin {Hurta} and Jana {Schwarzerová} and Thomas {Nägele} and Wolfram {Weckwerth} and Valentine {Provazník} and Lukáš {Sekanina}",
  title="Utilizing Genetic Programming to Enhance Polygenic Risk Score Calculation",
  booktitle="2023 IEEE International Conference on Bioinformatics and Biomedicine (BIBM 2023)",
  year="2023",
  pages="3782--3787",
  publisher="Institute of Electrical and Electronics Engineers",
  address="Istanbul",
  doi="10.1109/BIBM58861.2023.10385615",
  isbn="979-8-3503-3748-8",
  url="https://ieeexplore.ieee.org/document/10385615"
}