Publication detail

Lithographic thin–film structures based on Electrochromic materials: Case study by scanning probe microscopy

MISIUREV, D.

Original Title

Lithographic thin–film structures based on Electrochromic materials: Case study by scanning probe microscopy

Type

conference paper

Language

English

Original Abstract

The main object of this study will be based on producing and characterization of lithographic thin–film structures produced based electrochromic materials. Atomic force microscopy will be used as a main method of evaluation the morphology of lithographic structures. The optical properties of eslectrochromic materials will be analyze using scanning near–field optical microscopy by applying different electrical potential.

Keywords

AFM, SNOM, electrochromic materials, thin–films.

Authors

MISIUREV, D.

Released

26. 4. 2022

Publisher

Brno University of Technology, Faculty of Electrical Engineering and Communication

Location

Brno

ISBN

978-80-214-6029-4

Book

Proceedings I of the 28th Conference STUDENT EEICT 2022 General Papers

Edition

1

Pages from

409

Pages to

414

Pages count

6

URL

https://www.eeict.cz/eeict_download/archiv/sborniky/EEICT_2022_sbornik_1_v2.pdf

BibTex

@inproceedings{BUT178768,
  author="Denis {Misiurev}",
  title="Lithographic thin–film structures based on Electrochromic materials: Case study by scanning probe microscopy",
  booktitle="Proceedings I of the 28th Conference STUDENT EEICT 2022 General Papers",
  year="2022",
  series="1",
  pages="409--414",
  publisher="Brno University of Technology, Faculty of Electrical Engineering and Communication",
  address="Brno",
  isbn="978-80-214-6029-4",
  url="https://www.eeict.cz/eeict_download/archiv/sborniky/EEICT_2022_sbornik_1_v2.pdf"
}