Publication result detail

Evaluating the Far-Field Pattern from Near-Field Measurement using Statistic Methods of Phase Inaccuracy Suppression

Hertl I.

Original Title

Evaluating the Far-Field Pattern from Near-Field Measurement using Statistic Methods of Phase Inaccuracy Suppression

English Title

Evaluating the Far-Field Pattern from Near-Field Measurement using Statistic Methods of Phase Inaccuracy Suppression

Type

Paper in proceedings (conference paper)

Original Abstract

The paper presents possibility of using standard statistic methods for improving the process of evaluation of the far-field pattern from near-field planar measurement. Three basic situations of inaccuracy distribution (random, single systematic and multiple systematic) are discussed. Enumeration in the case of four-element dipole array is presented. The basic demands on measuring site and ways to achieve them are also outlined.

English abstract

The paper presents possibility of using standard statistic methods for improving the process of evaluation of the far-field pattern from near-field planar measurement. Three basic situations of inaccuracy distribution (random, single systematic and multiple systematic) are discussed. Enumeration in the case of four-element dipole array is presented. The basic demands on measuring site and ways to achieve them are also outlined.

Keywords

near-field, statistic methods

Key words in English

near-field, statistic methods

Authors

Hertl I.

Released

01.01.2005

Publisher

CVUT Praha

Location

Praha

Book

Proceedings of Poster 2005

Pages from

1

Pages count

3

BibTex

@inproceedings{BUT16882,
  author="Ivo {Hertl}",
  title="Evaluating the Far-Field Pattern from Near-Field Measurement using Statistic Methods of Phase Inaccuracy Suppression",
  booktitle="Proceedings of Poster 2005",
  year="2005",
  pages="3",
  publisher="CVUT Praha",
  address="Praha"
}