Publication detail

Noise in Passive Components - Resistors and Capacitors

PAVELKA, J., ŠIKULA, J., TACANO, M.

Original Title

Noise in Passive Components - Resistors and Capacitors

Type

conference paper

Language

English

Original Abstract

The noise spectroscopy and non-linearity measurement of thick film resistors and tantalum and niobium capacitors is proposed as a non-destructive testing tool for quality and reliability prediction. The correlation between long-term stability and current noise and third harmonic index of thick film resistors prepared using two different technologies was investigated. The charge carrier transport and noise analysis of Ta2O5 and Nb2O5 dielectric layer capacitors was performed to find correlation between leakage current and noise based quality indicators and optimize aging procedure

Key words in English

low-frequency noise, thick film resistors, tantalum capacitors, reliability

Authors

PAVELKA, J., ŠIKULA, J., TACANO, M.

Released

1. 1. 2002

Publisher

Meisei University

Location

Tokio

Pages from

110

Pages to

115

Pages count

6

BibTex

@inproceedings{BUT16521,
  author="Jan {Pavelka} and Josef {Šikula} and Munecazu {Tacano}",
  title="Noise in Passive Components - Resistors and Capacitors",
  booktitle="Proceedings of the 13th Symposium on Advanced Materials",
  year="2002",
  pages="6",
  publisher="Meisei University",
  address="Tokio"
}