Noise and optical spectroscopy of single junction silicon solar cell

Noise and optical spectroscopy of single junction silicon solar cell

WoS Article

Noise spectroscopy as a highly sensitive method for non-destructive diagnostics of semiconductor devices was applied to solar cells based on crystalline silicon with a view to evaluating the quality and reliability of this solar cell type. The experimental approach was used in a reverse-biased condition where the internal structure of solar cells, as well as pn junction itself, was electrically stressed and overloaded by a strong electric field. This gave a rise to a strong generation of a current noise accompanied by local thermal instabilities, especially in the defect sites. It turned out that local temperature changes could be correlated with a flicker noise generation in a wide frequency range. Furthermore, an electrical breakdown in a non-stable form also occurred in some specific local regions what created a microplasma noise with a two-level current fluctuation in form of the Lorentzian-like noise spectrum. The noise research was conducted on both these phenomena in combination with a spectrally-filtered electroluminescence mapping in a visible/near-infrared spectrum range and a dark lock-in infrared thermography in a far-infrared range. Then the physical origin of the light emission from the particular defects was searched by a scanning electron microscope and additionally was performed an experimental elimination of one specific defect by a focused ion beam milling.

Noise spectroscopy as a highly sensitive method for non-destructive diagnostics of semiconductor devices was applied to solar cells based on crystalline silicon with a view to evaluating the quality and reliability of this solar cell type. The experimental approach was used in a reverse-biased condition where the internal structure of solar cells, as well as pn junction itself, was electrically stressed and overloaded by a strong electric field. This gave a rise to a strong generation of a current noise accompanied by local thermal instabilities, especially in the defect sites. It turned out that local temperature changes could be correlated with a flicker noise generation in a wide frequency range. Furthermore, an electrical breakdown in a non-stable form also occurred in some specific local regions what created a microplasma noise with a two-level current fluctuation in form of the Lorentzian-like noise spectrum. The noise research was conducted on both these phenomena in combination with a spectrally-filtered electroluminescence mapping in a visible/near-infrared spectrum range and a dark lock-in infrared thermography in a far-infrared range. Then the physical origin of the light emission from the particular defects was searched by a scanning electron microscope and additionally was performed an experimental elimination of one specific defect by a focused ion beam milling.

non-destructive diagnostics, c-Si solar cells, 1/f noise, electroluminescence, lock-in IR thermography

non-destructive diagnostics, c-Si solar cells, 1/f noise, electroluminescence, lock-in IR thermography

ŠKVARENINA, Ľ.; MACKŮ, R.

2019

30.06.2018

Metrology and Measurement Systems

Poland: Gdańsk

0860-8229

Metrology and Measurement Systems

25

2

Republic of Poland

303

316

14

http://journals.pan.pl/Content/104031/PDF/art04.pdf