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PROCHÁZKA, M.; BLAHOVÁ, L.; KRČMA, F.; PŘIKRYL, R.
Original Title
Plasma Enhanced Chemical Vapour Deposition of SiO2-Like Films: Monitoring and Optimization of the Process
English Title
Type
Paper in proceedings (conference paper)
Original Abstract
This work focuses on high density thin films deposited by PECVD using hexamethyldisiloxane precursor. Optical emission spectroscopy was used for plasma diagnostics. Oxygen transmission rate and infrared spectra of deposited layers were measured. Optimal experimental conditions for low carbon content layers and layers with good barrier properties were determined.
English abstract
Keywords
Thin film deposition, optical emission spectroscopy, oxygen transmission rate
Key words in English
Authors
RIV year
2014
Released
07.12.2012
Publisher
FCH VUT
Location
Brno
ISBN
978-80-214-4644-1
Book
Studentská odborná konference Chemie je život 2012, Sborník příspěvků
Pages from
405
Pages to
408
Pages count
4
BibTex
@inproceedings{BUT101783, author="Michal {Procházka} and Lucie {Janů} and František {Krčma} and Radek {Přikryl}", title="Plasma Enhanced Chemical Vapour Deposition of SiO2-Like Films: Monitoring and Optimization of the Process", booktitle="Studentská odborná konference Chemie je život 2012, Sborník příspěvků", year="2012", pages="405--408", publisher="FCH VUT", address="Brno", isbn="978-80-214-4644-1" }