RELIANCE brings together a consortium of leading international experts in X-ray scattering, imaging and automatized analysis of scattering data, 3D reconstruction algorithms and automatized analysis of imaging data and Materials Applications, with industrial leaders in manufacturing and application of high-performance polymer materials, and in highly specialized X-ray instrumentation and scientific data acquisition and analysis.

Keywords
Small and Wide Angle X-ray Scattering; X-ray Imaging; X-ray Tomography

101073040

English

Kaiser Jozef, prof. Ing., Ph.D. - principal person responsible
Břínek Adam, Ing. - fellow researcher

Advanced instrumentation and methods for material characterization
- responsible department (9.5.2022 - not assigned)
Advanced instrumentation and methods for material characterization
- beneficiary (9.5.2022 - not assigned)

Responsibility: Kaiser Jozef, prof. Ing., Ph.D.